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Title: Atomic scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the stem

Abstract

The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models. Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. In this paper we use the complimentary techniques of high resolution Z-contrast imaging and PEELS to investigate the atomic structure and chemistry of a 25{degree} symmetric tilt boundary in a bicrystal of the electroceramic SrTiO{sub 3}.

Authors:
; ; ; ;  [1]; ;  [2]
  1. Oak Ridge National Lab., TN (United States)
  2. Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
Publication Date:
Research Org.:
Oak Ridge National Lab., TN (United States); Northwestern Univ., Evanston, IL (United States). Dept. of Materials Science and Engineering
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10158790
Report Number(s):
CONF-940411-26
ON: DE94013632; BR: KC0201010
DOE Contract Number:  
AC05-84OR21400; FG02-92ER45475
Resource Type:
Conference
Resource Relation:
Conference: Spring meeting of the Materials Research Society (MRS),San Francisco, CA (United States),4-8 Apr 1994; Other Information: PBD: May 1994
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CERAMICS; SPECTROSCOPY; ENERGY-LOSS SPECTROSCOPY; ELECTRONIC STRUCTURE; INTERFACES; GRAIN BOUNDARIES; ELECTRON MICROSCOPY; STRONTIUM OXIDES; TITANIUM OXIDES; 400102; 360202; 665000; CHEMICAL AND SPECTRAL PROCEDURES; STRUCTURE AND PHASE STUDIES; PHYSICS OF CONDENSED MATTER

Citation Formats

McGibbon, M.M., Browning, N.D., Chisholm, M.F., McGibbon, A.J., Pennycook, S.J., Ravikumar, V., and Dravid, V.P. Atomic scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the stem. United States: N. p., 1994. Web.
McGibbon, M.M., Browning, N.D., Chisholm, M.F., McGibbon, A.J., Pennycook, S.J., Ravikumar, V., & Dravid, V.P. Atomic scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the stem. United States.
McGibbon, M.M., Browning, N.D., Chisholm, M.F., McGibbon, A.J., Pennycook, S.J., Ravikumar, V., and Dravid, V.P. Sun . "Atomic scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the stem". United States. https://www.osti.gov/servlets/purl/10158790.
@article{osti_10158790,
title = {Atomic scale structure and chemistry of interfaces by Z-contrast imaging and electron energy loss spectroscopy in the stem},
author = {McGibbon, M.M. and Browning, N.D. and Chisholm, M.F. and McGibbon, A.J. and Pennycook, S.J. and Ravikumar, V. and Dravid, V.P.},
abstractNote = {The macroscopic properties of many materials are controlled by the structure and chemistry at grain boundaries. A basic understanding of the structure-property relationship requires a technique which probes both composition and chemical bonding on an atomic scale. High-resolution Z-contrast imaging in the scanning transmission electron microscope (STEM) forms an incoherent image in which changes in atomic structure and composition across an interface can be interpreted directly without the need for preconceived atomic structure models. Since the Z-contrast image is formed by electrons scattered through high angles, parallel detection electron energy loss spectroscopy (PEELS) can be used simultaneously to provide complementary chemical information on an atomic scale. The fine structure in the PEEL spectra can be used to investigate the local electronic structure and the nature of the bonding across the interface. In this paper we use the complimentary techniques of high resolution Z-contrast imaging and PEELS to investigate the atomic structure and chemistry of a 25{degree} symmetric tilt boundary in a bicrystal of the electroceramic SrTiO{sub 3}.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {1994},
month = {5}
}

Conference:
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