Small-scale Materials Behavior from X-ray Microdiffraction and Imaging

Journal Article · Fri Jan 01 04:00:00 EST 2010 · Journal of the Minerals Metals & Materials Society (JOM)

DOI:https://doi.org/10.1007/s11837-010-0175-7· OSTI ID:1009951

Barabash, Rozaliya ^[1]; Ice, Gene E ^[1]

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1. ORNL

This commentary introduces a JOM topic that highlights novel applications of x-ray microdiffraction and imaging to study structural properties of materials at a small scale. The development of ultra-brilliant synchrotron x-ray sources provides important new opportunities for the analysis of local and near-surface material structures. This topic includes manuscripts that describe how different versions of polychromatic and monochromatic microdiffraction can be used to study small scale plasticity in a range of materials. A variety of ingenious methods are described as developed in laboratories around the world.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1009951
• Journal Information: Journal of the Minerals Metals & Materials Society (JOM), Journal Name: Journal of the Minerals Metals & Materials Society (JOM) Journal Issue: 12 Vol. 62; ISSN 1047-4838
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
MICROANALYSIS
MICROSTRUCTURE
PLASTICITY
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
X-RAY SOURCES