Polychromatic X-Ray Microdiffraction Studies of Mesoscale Structure and Dynamics

Journal Article · Fri Dec 31 23:00:00 EST 2004 · Journal of Synchrotron Radiation

DOI:https://doi.org/10.1107/S0909049504026949· OSTI ID:1003321

Ice, Gene E ^[1]; Larson, Ben C ^[1]; Yang, Wenge ^[1]; Budai, John D ^[1]; Tischler, Jonathan Zachary ^[1]; Pang, Louis ^[1]; Barabash, Rozaliya ^[1]; Liu, Wei ^[1]

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1. ORNL

Polychromatic X-ray microdiffraction is an emerging tool for studying mesoscale structure and dynamics. Crystalline phase, orientation (texture), elastic and plastic strain can be nondestructively mapped in three dimensions with good spatial and angular resolution. Local crystallographic orientation can be determined to {approx}0.01{sup o} and elastic strain tensor elements can be measured with a resolution of {approx}10{sup -4} or better. Complete strain tensor information can be obtained by augmenting polychromatic microdiffraction with a monochromatic measurement of one Laue-reflection energy. With differential-aperture depth profiling, volumes tens to hundreds of micrometers below the surface are accessible so that three-dimensional distributions of crystalline morphology including grain boundaries, triple points, second phases and inclusions can all be mapped. Volume elements below 0.25 {micro}m{sup 3} are routinely resolved so that the grain boundary structure of most materials can be characterized. Here the theory, instrumentation and application of polychromatic microdiffraction are described.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1003321
• Journal Information: Journal of Synchrotron Radiation, Journal Name: Journal of Synchrotron Radiation Journal Issue: 2 Vol. 12; ISSN 0909-0495
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
GRAIN BOUNDARIES
MICROANALYSIS
MORPHOLOGY
ORIENTATION
PERFORMANCE
RESOLUTION
STRAINS
TEXTURE
TRIPLE POINT
X-RAY DIFFRACTION