Direct Sub-Angstrom Imaging of a Crystal Lattice

Journal Article · Thu Jan 01 04:00:00 EST 2004 · Science

DOI:https://doi.org/10.1126/science.1100965· OSTI ID:1003086

Nellist, Peter D. ^[1]; Chisholm, Matthew F ^[2]; Dellby, N. ^[1]; Krivanek, O. L. ^[3]; Murfitt, M. F. ^[1]; Szilagyi, Z. S. ^[1]; Lupini, Andrew R ^[2]; Borisevich, Albina Y ^[2]; Pennycook, Stephen J ^[2]

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1. Nion Company, WA
2. ORNL
3. National Institute of Standards and Technology (NIST)

Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are separated by less than 0.1 nanometer.

• Research Organization: Oak Ridge National Laboratory (ORNL)
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1003086
• Journal Information: Science, Journal Name: Science Journal Issue: 5691 Vol. 305; ISSN 1095-9203; ISSN 0036-8075
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
CRYSTAL LATTICES
ELECTRON MICROSCOPES
GEOMETRICAL ABERRATIONS
IMAGES
SCANNING ELECTRON MICROSCOPY
SPATIAL RESOLUTION
TRANSMISSION ELECTRON MICROSCOPY