Error correcting code with chip kill capability and power saving enhancement
- Mount Kisco, NY
- Croton On Husdon, NY
- Yorktown Heights, NY
- Rochester, MN
- Brewster, NY
- Scarsdale, NY
A method and system are disclosed for detecting memory chip failure in a computer memory system. The method comprises the steps of accessing user data from a set of user data chips, and testing the user data for errors using data from a set of system data chips. This testing is done by generating a sequence of check symbols from the user data, grouping the user data into a sequence of data symbols, and computing a specified sequence of syndromes. If all the syndromes are zero, the user data has no errors. If one of the syndromes is non-zero, then a set of discriminator expressions are computed, and used to determine whether a single or double symbol error has occurred. In the preferred embodiment, less than two full system data chips are used for testing and correcting the user data.
- Research Organization:
- International Business Machines Corp., Armonk, NY (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- B554331
- Assignee:
- International Business Machines Corporation (Armonk, NY)
- Patent Number(s):
- 8,010,875
- Application Number:
- 11/768,559
- OSTI ID:
- 1023908
- Resource Relation:
- Patent File Date: 2007 Jun 26
- Country of Publication:
- United States
- Language:
- English
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