Infrared microscope inspection apparatus
Abstract
Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.
- Inventors:
-
- Framingham, MA
- Concord, MA
- Issue Date:
- Research Org.:
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- OSTI Identifier:
- 865358
- Patent Number(s):
- 4501966
- Application Number:
- 06/243,415
- Assignee:
- Massachusetts Institute of Technology (Cambridge, MA)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01N - INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- DOE Contract Number:
- AC02-76ET20279
- Resource Type:
- Patent
- Country of Publication:
- United States
- Language:
- English
- Subject:
- infrared; microscope; inspection; apparatus; inspecting; transparents; array; photovoltaic; modules; containing; silicon; solar; cells; sources; light; placed; axes; intersect; center; field; means; sending; reflected; adapted; mounted; x-y; translator; positioned; adjacent; surface; infrared light; photovoltaic modules; photovoltaic module; solar cell; solar cells; silicon solar; positioned adjacent; reflected light; inspection apparatus; modules containing; containing silicon; infrared microscope; infrared transparent; /250/348/
Citation Formats
Forman, Steven E, and Caunt, James W. Infrared microscope inspection apparatus. United States: N. p., 1985.
Web.
Forman, Steven E, & Caunt, James W. Infrared microscope inspection apparatus. United States.
Forman, Steven E, and Caunt, James W. Tue .
"Infrared microscope inspection apparatus". United States. https://www.osti.gov/servlets/purl/865358.
@article{osti_865358,
title = {Infrared microscope inspection apparatus},
author = {Forman, Steven E and Caunt, James W},
abstractNote = {Apparatus and system for inspecting infrared transparents, such as an array of photovoltaic modules containing silicon solar cells, includes an infrared microscope, at least three sources of infrared light placed around and having their axes intersect the center of the object field and means for sending the reflected light through the microscope. The apparatus is adapted to be mounted on an X-Y translator positioned adjacent the object surface.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Feb 26 00:00:00 EST 1985},
month = {Tue Feb 26 00:00:00 EST 1985}
}