Microscopic infrared analysis by X-ray or electron radiation

Rosenberg, Richard A.

Title: Microscopic infrared analysis by X-ray or electron radiation

Patent · Tue Jan 31 00:00:00 EST 2012

OSTI ID:1531836

Rosenberg, Richard A.

An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-06CH11357; W-31-109-ENG-38

Assignee:: UChicago Argonne, LLC (Chicago, IL)

Patent Number(s):: 8,106,360

Application Number:: 12/789,823

OSTI ID:: 1531836

Resource Relation:: Patent File Date: 2010-05-28

Country of Publication:: United States

Language:: English

References (14)

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