Microscopic infrared analysis by X-ray or electron radiation
Abstract
An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.
- Inventors:
- Issue Date:
- Research Org.:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1531836
- Patent Number(s):
- 8106360
- Application Number:
- 12/789,823
- Assignee:
- UChicago Argonne, LLC (Chicago, IL)
- Patent Classifications (CPCs):
-
G - PHYSICS G01 - MEASURING G01J - MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT
- DOE Contract Number:
- AC02-06CH11357; W-31-109-ENG-38
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 2010-05-28
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 42 ENGINEERING; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
Citation Formats
Rosenberg, Richard A. Microscopic infrared analysis by X-ray or electron radiation. United States: N. p., 2012.
Web.
Rosenberg, Richard A. Microscopic infrared analysis by X-ray or electron radiation. United States.
Rosenberg, Richard A. Tue .
"Microscopic infrared analysis by X-ray or electron radiation". United States. https://www.osti.gov/servlets/purl/1531836.
@article{osti_1531836,
title = {Microscopic infrared analysis by X-ray or electron radiation},
author = {Rosenberg, Richard A.},
abstractNote = {An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jan 31 00:00:00 EST 2012},
month = {Tue Jan 31 00:00:00 EST 2012}
}
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