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Title: Digital lock-in detection of site-specific magnetism in magnetic materials

Patent ·
OSTI ID:943335

The polarization and diffraction characteristics of x-rays incident upon a magnetic material are manipulated to provide a desired magnetic sensitivity in the material. The contrast in diffracted intensity of opposite helicities of circularly polarized x-rays is measured to permit separation of magnetic signals by element type and by atomic environment. This allows for the direct probing of magnetic signals from elements of the same species in nonequivalent atomic environments to better understand the behavior and characteristics of permanent magnetic materials. By using known crystallographic information together with manipulation of the polarization of x-rays having energies tuned near element-specific electronic excitations and by detecting and comparing the incident and diffracted photons at the same frequency, more accurate magnetic measurements can be made over shorter observation periods.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
W-31109-ENG-38
Assignee:
The United States of America as represented by the Department of Energy (Washington, DC)
Patent Number(s):
7,403,592
Application Number:
11/447,511
OSTI ID:
943335
Country of Publication:
United States
Language:
English

References (2)

Magnetic properties of transition-metal multilayers studied with X-ray magnetic circular dichroism spectroscopy journal January 1998
X-ray magnetic circular dichroism—a high energy probe of magnetic properties journal January 2005

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