Heterodyne interferometer with angstrom-level periodic nonlinearity

Schmitz, Tony L; Beckwith, John F

Title: Heterodyne interferometer with angstrom-level periodic nonlinearity

Patent · Tue Jan 25 00:00:00 EST 2005

OSTI ID:920035

Schmitz, Tony L ^[1]; Beckwith, John F ^[2]

Gainesville, FL
Indialantic, FL

Displacement measuring interferometer systems and methods are disclosed. One or more acousto-optic modulators for receiving a laser light beam from a laser light source can be utilized to split the laser light beam into two or more laser light beams, while spatially separating frequencies thereof. One or more reflective mechanisms can be utilized to reflect one or more of the laser light beams back to the acousto-optic modulator. Interference of two or more of the laser light beams generally at the acousto-optic modulator can provide an interfered laser light beam thereof. A detector for receiving the interfered laser light beam can be utilized to provide interferometer measurement data.

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Sponsoring Organization:: USDOE

Assignee:: The United States of America as represented by the Department of Energy (Washington, DC)

Patent Number(s):: 6,847,455

Application Number:: 10/254,567

OSTI ID:: 920035

Country of Publication:: United States

Language:: English

References (13)

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Heterodyne interferometer with subatomic periodic nonlinearity Wu, Chien-ming; Lawall, John; Deslattes, Richard D. Applied Optics, Vol. 38, Issue 19 https://doi.org/10.1364/AO.38.004089	journal	January 1999

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