Electrochemical fabrication of capacitors
Patent
·
OSTI ID:872746
- Fairfax Sta., VA
- Lemont, IL
A film of nickel oxide is anodically deposited on a graphite sheet held in osition on an electrochemical cell during application of a positive electrode voltage to the graphite sheet while exposed to an electrolytic nickel oxide solution within a volumetrically variable chamber of the cell. An angularly orientated x-ray beam is admitted into the cell for transmission through the deposited nickel oxide film in order to obtain structural information while the film is subject to electrochemical and in-situ x-ray spectroscopy from which optimum film thickness, may be determined by comparative analysis for capacitor fabrication purposes.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- DOE Contract Number:
- W-31109-ENG-38
- Assignee:
- United States of America as represented by Secretary of Navy (Washington, DC)
- Patent Number(s):
- US 6001237
- OSTI ID:
- 872746
- Country of Publication:
- United States
- Language:
- English
Similar Records
Electrochemical fabrication of capacitors
Growth and electrochemical characterization of single phase Mo{sub x}N films for fabrication of hybrid double layer capacitors
``In-situ'' spectro-electrochemical studies of radionuclide-contaminated surface films on metals
Patent
·
Tue Dec 14 00:00:00 EST 1999
·
OSTI ID:872746
Growth and electrochemical characterization of single phase Mo{sub x}N films for fabrication of hybrid double layer capacitors
Conference
·
Wed Jul 01 00:00:00 EDT 1998
·
OSTI ID:872746
+1 more
``In-situ'' spectro-electrochemical studies of radionuclide-contaminated surface films on metals
Technical Report
·
Wed Feb 16 00:00:00 EST 2000
·
OSTI ID:872746
Related Subjects
electrochemical
fabrication
capacitors
film
nickel
oxide
anodically
deposited
graphite
sheet
held
osition
cell
application
positive
electrode
voltage
exposed
electrolytic
solution
volumetrically
variable
chamber
angularly
orientated
x-ray
beam
admitted
transmission
obtain
structural
information
subject
in-situ
spectroscopy
optimum
thickness
determined
comparative
analysis
capacitor
purposes
comparative analysis
film thickness
x-ray beam
positive electrode
electrochemical cell
nickel oxide
oxide film
graphite sheet
oxide solution
ray spectroscopy
electrode voltage
deposited nickel
/205/204/
fabrication
capacitors
film
nickel
oxide
anodically
deposited
graphite
sheet
held
osition
cell
application
positive
electrode
voltage
exposed
electrolytic
solution
volumetrically
variable
chamber
angularly
orientated
x-ray
beam
admitted
transmission
obtain
structural
information
subject
in-situ
spectroscopy
optimum
thickness
determined
comparative
analysis
capacitor
purposes
comparative analysis
film thickness
x-ray beam
positive electrode
electrochemical cell
nickel oxide
oxide film
graphite sheet
oxide solution
ray spectroscopy
electrode voltage
deposited nickel
/205/204/