Method and apparatus for automatically detecting patterns in digital point-ordered signals
- Albany, NY
The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the data. The present invention can properly handle a non-periodic signal. A physical parameter of the test piece is measured. A digital point-ordered signal representative of the measured physical parameter is generated. The digital point-ordered signal is decomposed into a baseline signal, a background noise signal, and a peaks/troughs signal. The peaks/troughs from the peaks/troughs signal are located and peaks/troughs information indicating the physical feature of the test piece is output.
- Research Organization:
- Knolls Atomic Power Laboratory (KAPL), Niskayuna, NY (United States)
- DOE Contract Number:
- AC12-76SN00052
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 5825672
- OSTI ID:
- 871924
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
apparatus
automatically
detecting
patterns
digital
point-ordered
signals
physical
feature
piece
pattern
signal
representing
data
inspection
detected
automated
additive
decomposition
represents
properly
handle
non-periodic
parameter
measured
representative
generated
decomposed
baseline
background
noise
peaks
troughs
located
information
indicating
output
noise signal
physical parameter
digital point-ordered
automatically detecting
signal representing
signal representative
background noise
point-ordered signal
point-ordered signals
representing data
automatically detect
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