Apparatus for and method of testing an electrical ground fault circuit interrupt device
- 2181-13th Ave. SW., Largo, FL 34640
An apparatus for testing a ground fault circuit interrupt device includes a processor, an input device connected to the processor for receiving input from an operator, a storage media connected to the processor for storing test data, an output device connected to the processor for outputting information corresponding to the test data to the operator, and a calibrated variable load circuit connected between the processor and the ground fault circuit interrupt device. The ground fault circuit interrupt device is configured to trip a corresponding circuit breaker. The processor is configured to receive signals from the calibrated variable load circuit and to process the signals to determine a trip threshold current and/or a trip time. A method of testing the ground fault circuit interrupt device includes a first step of providing an identification for the ground fault circuit interrupt device. Test data is then recorded in accordance with the identification. By comparing test data from an initial test with test data from a subsequent test, a trend of performance for the ground fault circuit interrupt device is determined.
- Research Organization:
- LOCKHEED MARTIN SPEC COMPONENT
- DOE Contract Number:
- AC04-92AL73000
- Assignee:
- Andrews, Lowell B. (2181-13th Ave. SW., Largo, FL 34640)
- Patent Number(s):
- US 5796636
- OSTI ID:
- 871792
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
method
testing
electrical
ground
fault
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processor
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operator
storage
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storing
data
output
outputting
information
corresponding
calibrated
variable
load
configured
trip
breaker
receive
signals
process
determine
threshold
current
time
step
providing
identification
recorded
accordance
comparing
initial
subsequent
trend
performance
determined
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output device
fault circuit
electrical ground
interrupt device
load circuit
circuit connected
circuit breaker
ground fault
storage media
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variable load
trip time
input device
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