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Title: Inclined monochromator for high heat-load synchrotron x-ray radiation

Patent ·
OSTI ID:869165

A double crystal monochromator including two identical, parallel crystals, each of which is cut such that the normal to the diffraction planes of interest makes an angle less than 90 degrees with the surface normal. Diffraction is symmetric, regardless of whether the crystals are symmetrically or asymmetrically cut, enabling operation of the monochromator with a fixed plane of diffraction. As a result of the inclination of the crystal surface, an incident beam has a footprint area which is elongated both vertically and horizontally when compared to that of the conventional monochromator, reducing the heat flux of the incident beam and enabling more efficient surface cooling. Because after inclination of the crystal only a fraction of thermal distortion lies in the diffraction plane, slope errors and the resultant misorientation of the diffracted beam are reduced.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
DOE Contract Number:
W-31109-ENG-38
Assignee:
United States of America as represented by United States (Washington, DC)
Patent Number(s):
US 5287395
OSTI ID:
869165
Country of Publication:
United States
Language:
English

References (4)

Self‐filtering crystal monochromators for synchrotron x radiation journal July 1989
A novel monochromator for high heat load synchrotron x‐ray radiation journal January 1992
Double crystal monochromator for synchrotron radiation with decreased radiation power density journal January 1992
A `parallel-beam' concentrating monochromator for X-rays journal July 1948