Quantitative method for measuring heat flux emitted from a cryogenic object

Patent · Fri Jan 01 00:00:00 EST 1993

OSTI ID:868695

Duncan, Robert V ^[1]

---

1. Tijeras, NM

The present invention is a quantitative method for measuring the total heat flux, and of deriving the total power dissipation, of a heat-fluxing object which includes the steps of placing an electrical noise-emitting heat-fluxing object in a liquid helium bath and measuring the superfluid transition temperature of the bath. The temperature of the liquid helium bath is thereafter reduced until some measurable parameter, such as the electrical noise, exhibited by the heat-fluxing object or a temperature-dependent resistive thin film in intimate contact with the heat-fluxing object, becomes greatly reduced. The temperature of the liquid helum bath is measured at this point. The difference between the superfluid transition temperature of the liquid helium bath surrounding the heat-fluxing object, and the temperature of the liquid helium bath when the electrical noise emitted by the heat-fluxing object becomes greatly reduced, is determined. The total heat flux from the heat-fluxing object is determined as a function of this difference between these temperatures. In certain applications, the technique can be used to optimize thermal design parameters of cryogenic electronics, for example, Josephson junction and infra-red sensing devices.

• Research Organization: AT&T
• DOE Contract Number: AC04-76DP00789
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 5193909
• OSTI ID: 868695
• Country of Publication: United States
• Language: English

Related Subjects

quantitative
method
measuring
heat
flux
emitted
cryogenic
total
deriving
power
dissipation
heat-fluxing
steps
placing
electrical
noise-emitting
liquid
helium
bath
superfluid
transition
temperature
thereafter
reduced
measurable
parameter
noise
exhibited
temperature-dependent
resistive
film
intimate
contact
greatly
helum
measured
difference
surrounding
determined
function
temperatures
applications
technique
optimize
thermal
design
parameters
electronics
example
josephson
junction
infra-red
sensing
devices
power dissipation
josephson junction
measuring heat
heat flux
intimate contact
sensing device
transition temperature
greatly reduced
liquid helium
quantitative method
sensing devices
total heat
electrical noise
total power
greatly reduce
design parameters
/374/