High resolution collimator system for X-ray detector

Patent · Thu Jan 01 00:00:00 EST 1987

OSTI ID:866117

Eberhard, Jeffrey W ^[1]; Cain, Dallas E ^[2]

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1. Schenectady, NY
2. Scotia, NY

High resolution in an X-ray computerized tomography (CT) inspection system is achieved by using a collimator/detector combination to limit the beam width of the X-ray beam incident on a detector element to the desired resolution width. In a detector such as a high pressure Xenon detector array, a narrow tapered collimator is provided above a wide detector element. The collimator slits have any desired width, as small as a few mils at the top, the slit width is easily controlled, and they are fabricated on standard machines. The slit length determines the slice thickness of the CT image.

• DOE Contract Number: NPD808763AM
• Assignee: General Electric Company (Schenectady, NY)
• Patent Number(s): US 4638499
• OSTI ID: 866117
• Country of Publication: United States
• Language: English

Related Subjects

resolution
collimator
x-ray
detector
computerized
tomography
inspection
achieved
combination
limit
beam
width
incident
element
desired
pressure
xenon
array
narrow
tapered
provided
wide
slits
mils
top
slit
easily
controlled
fabricated
standard
machines
length
determines
slice
thickness
image
x-ray detector
detector array
x-ray beam
detector element
slit width
beam incident
pressure xenon
narrow tapered
easily controlled
ray detector
computerized tomography
detector combination
/378/250/976/