Apparatus for measuring resistance change only in a cell analyzer and method for calibrating it

Patent · Tue Jan 01 00:00:00 EST 1980

OSTI ID:863659

Hoffman, Robert A ^[1]

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1. Los Alamos, NM

The disclosure relates to resistance only monitoring and calibration in an electrical cell analyzer. Sample and sheath fluid flows of different salinities are utilized, the sample flow being diameter modulated to produce a selected pattern which is compared to the resistance measured across the flows.

• Research Organization: Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
• Assignee: United States of America as represented by United States (Washington, DC)
• Patent Number(s): US 4224567
• OSTI ID: 863659
• Country of Publication: United States
• Language: English

Related Subjects

apparatus
measuring
resistance
change
cell
analyzer
method
calibrating
disclosure
relates
monitoring
calibration
electrical
sample
sheath
fluid
flows
salinities
utilized
flow
diameter
modulated
produce
selected
pattern
compared
measured
fluid flow
disclosure relates
fluid flows
sheath fluid
resistance measured
cell analyzer
sample flow
resistance change
measuring resistance
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