Recombination Lifetimes Using the RCPCD Technique: Comparison with Other Methods

Conference · Sat Jan 01 00:00:00 EST 2005

OSTI ID:860932

Ahrenkiel, R K; Johnston, S W; Dashdorj, J

The theory and operation of the resonance-coupled photoconductive decay (RCPCD) technique is described. Examples are presented of data measured on a wide variety of sample types. The RCPCD technique has been applied to a variety of wafer and thin-film materials. Using this technique, we can measure recombination lifetime over at least three decades of injection level. We can also measure relative values of minority-carrier mobility and diffusion length. By scanning the excitation wavelength, we can measure spectral response and photoconductive excitation spectra. Deep-level impurities have been detected by several variations of RCPCD.

• Research Organization: National Renewable Energy Lab. (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC36-99-GO10337
• OSTI ID: 860932
• Report Number(s): NREL/CP-520-37084; TRN: US200524%%377
• Resource Relation: Related Information: Presented at the 2004 DOE Solar Energy Technologies Program Review Meeting, 25-28 October 2004, Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102005-2067; NREL/CD-520-37140)
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
DECAY
DIFFUSION LENGTH
EXCITATION
IMPURITIES
LIFETIME
RECOMBINATION
SPECTRA
SPECTRAL RESPONSE
SOLAR ENERGY
PV
RESONANCE-COUPLED PHOTOCONDUCTIVE DECAY (RCPCD)
THIN-FILMS
RECOMBINATION LIFETIME
MINORITY-CARRIER
MOBILITY
INJECTION-LEVEL SPECTROSCOPY (ILS)
PHOTODETECTORS
Solar Energy - Photovoltaics