In situ measurement of fatigue-crack growth rates in a silicon carbide ceramic at elevated temperatures using a D.C. potential system
Journal Article
·
· Journal of Testing and Evaluation
OSTI ID:789102
The understanding of the mechanisms of fatigue-crack propagation in advanced ceramics at elevated temperatures (>800 degrees C) has in part been hampered by the experimental difficulty in directly measuring crack lengths, and hence crack-growth rates, at such high temperatures.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Director, Office of Science (US)
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 789102
- Report Number(s):
- LBNL-44354; R&D Project: 511906; TRN: AH200137%%313
- Journal Information:
- Journal of Testing and Evaluation, Vol. 28, Issue 4; Other Information: Journal Publication Date: Jul. 2000; PBD: 12 Oct 1999
- Country of Publication:
- United States
- Language:
- English
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