Lifetime and radiative efficiency vs density in the strain-confined electron-hole liquid in Ge
Conference
·
OSTI ID:6918057
Experiments on the electron-hole liquid (EHL) in inhomogeneously stressed Ge were performed in order to obtain information on the lifetime and radiative efficiency as a function of e-h pair density in the strain-confined electron-hole liquid (SCEHL). The data can only be explained if a density-independent recombination mechanism is the most important decay process. The result is shown to be consistent with other experiments indicating that such a mechanism has a negligible effect on the recombination time in unstressed Ge.
- Research Organization:
- California Univ., Berkeley (USA). Lawrence Berkeley Lab.
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6918057
- Report Number(s):
- LBL-7368; CONF-780827-1; TRN: 78-017821
- Resource Relation:
- Conference: Conference on recombination in semiconductors, Southampton, UK, 30 Aug 1978
- Country of Publication:
- United States
- Language:
- English
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