An improved double fluorescence detector for fluorescence EXAFS (Extended X-ray Absorption Fine Structure) measurements

Conference · Fri Jan 01 00:00:00 EST 1988

OSTI ID:6710783

Heald, S M

In many cases the fluorescence EXAFS signal is contaminated with fluorescence from nearby elements. If this fluorescence is of lower energy than the element of interest, x-ray filters are not effective. One method for dealing with this problem is the double fluorescence method described by Wong and Rao. This paper describes an improved version of this double fluorescence scheme which greatly improves its efficiency. Data are presented for a sample of 1/2% Hf in Ni/sub 3/Al, and 1.6% CuO in NiO. When standard fluorescence is used, both signals are almost completely obscured by the approx. =100X larger Ni K fluorescence signal. With the double fluorescence detector the Hf L/sub 3/ and Cu K-edge signals are clearly observed and good spectra can be obtained in about an hour. 4 refs., 4 figs.

• Research Organization: Brookhaven National Lab., Upton, NY (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 6710783
• Report Number(s): BNL-41812; CONF-8808141-3; ON: DE89002173
• Resource Relation: Conference: 3. international conference on synchrotron radiation instrumentation, Tokyo, Japan, 29 Aug 1988; Other Information: Portions of this document are illegible in microfiche products
• Country of Publication: United States
• Language: English

Related Subjects

47 OTHER INSTRUMENTATION
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COPPER OXIDES
FLUORESCENCE
HAFNIUM
RADIATION DETECTORS
EFFICIENCY
ALUMINIUM COMPOUNDS
FLUORESCENCE SPECTROSCOPY
NICKEL COMPOUNDS
NICKEL OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
ELEMENTS
EMISSION SPECTROSCOPY
LUMINESCENCE
MEASURING INSTRUMENTS
METALS
OXIDES
OXYGEN COMPOUNDS
SPECTROSCOPY
TRANSITION ELEMENT COMPOUNDS
TRANSITION ELEMENTS
440300* - Miscellaneous Instruments- (-1989)
656003 - Condensed Matter Physics- Interactions between Beams & Condensed Matter- (1987-)