Soft x-ray emission studies of the electronic structure in silicon nanoclusters
Conference
·
OSTI ID:632726
Density of states changes in the valence and conduction band of silicon nanoclusters were monitored using soft x-ray emission and absorption spectroscopy as a function of cluster size. a progressive increase in the valence band edge toward lower energy is found fro clusters with decreasing diameters. A similar but smaller shift is observed in the near-edge x-ray absorption data of the silicon nanoclusters.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48; AC03-76SF00098; AC02-76CH00016
- OSTI ID:
- 632726
- Report Number(s):
- UCRL-JC-126559; CONF-961202-; ON: DE98050226
- Resource Relation:
- Conference: 1996 Fall meeting of the Materials Research Society (MRS), Boston, MA (United States), 2-6 Dec 1996; Other Information: PBD: 1 Feb 1997
- Country of Publication:
- United States
- Language:
- English
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