Mobility and trapping time in HgI/sub 2/: a comparison of measurement methods and results
The charge transport parameters of a solid-state nuclear radiation detector are of paramount importance in determining the spectrometric performance. The free drift lengths (lambda) for electrons and holes are given in terms of the products of mobility (..mu..) and trapping time (tau) for electrons and holes. For good spectrometric performance the carrier free drift lengths should be much greater than the thickness of the detector. The ..mu.. tau product is so important in this regard that different solid-state detector materials are compared on the basis of their ..mu.. tau values, and for a given material progress is gauged by the current value of ..mu.. tau which it is possible to achieve. Workers in the field are fond of plotting ..mu.. tau versus time (in years, usually) to show how the state-of-the-art is advancing, often towards some asymptotic value. Different methods of measuring the charge transport parameters of mercuric iodide (HGI/sub 2/) are discussed and experimental values are presented. (WHK)
- Research Organization:
- EG and G, Inc., Santa Barbara, CA (USA); University of Southern California, Marina Del Rey (USA). Inst. for Physics and Imaging Science
- DOE Contract Number:
- AC08-76NV01183
- OSTI ID:
- 5253888
- Report Number(s):
- CONF-820667-7; ON: DE82016693; TRN: 82-016364
- Resource Relation:
- Conference: 5. international workshop on HgI/sub 2/ nuclear radiation detectors, Jerusalem, Israel, 6 Jun 1982; Other Information: Portions of document are illegible
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
HGI2 SEMICONDUCTOR DETECTORS
CARRIER MOBILITY
CRYSTAL GROWTH
MEASURING METHODS
MERCURY IODIDES
PULSE RISE TIME
TRAPPING
HALIDES
HALOGEN COMPOUNDS
IODIDES
IODINE COMPOUNDS
MEASURING INSTRUMENTS
MERCURY COMPOUNDS
MERCURY HALIDES
MOBILITY
RADIATION DETECTORS
SEMICONDUCTOR DETECTORS
TIMING PROPERTIES
440101* - Radiation Instrumentation- General Detectors or Monitors & Radiometric Instruments