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Title: Electrical characterization and application of very high speed vertical cavity surface emitting lasers (VCSELs)

Conference ·
OSTI ID:471436

Vertical Cavity Surface Emitting Lasers (VCSELs) offer many benefits over conventional edge-emitting lasers including economical microelectronic batch processing, easy extension to 2-D arrays, and of interest here, very large intrinsic bandwidths due to reduced cavity volume. Results of electrical characterization of a 19 GHz bandwidth 850 nm VCSEL are presented. Small-signal characterization and modeling of the frequency response and device impedance is presented. Large signal performance is studied using two-tone RF and high-speed digital measurements. Appropriate drive conditions for high-speed digital applications are demonstrated.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Financial Management and Controller, Washington, DC (United States)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
471436
Report Number(s):
SAND-97-0743C; CONF-970638-1; ON: DE97004039; TRN: 97:003082
Resource Relation:
Conference: IEEE MTT-S international microwave symposium, Denver, CO (United States), 8-13 Jun 1997; Other Information: PBD: 1997
Country of Publication:
United States
Language:
English