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Title: TEMPERATURE DEPENDENCE OF TAFEL SLOPE IN THE FORMATION OF VERY THIN ANODIC OXIDE FILMS ON NIOBIUM

Technical Report ·
DOI:https://doi.org/10.2172/4315076· OSTI ID:4315076

A kinetic study was made of the formation of very thin anodic oxide films on niobium at constant current over the temperature range --10 to 70 deg C. Formation voltages were limited to the range below the oxygen evolution potential to eliminate possible interaction of an electronic component of the current with the measured formation field. It was found that the measured temperature dependence of Tafel slope agreed with that predicted by the theory of Mott and Cabrera. Using this theory, a zero field interfacial barrier height of 1.19 ev and a half-jump distance of 2.40 A were obtained. Values of the differential formation field are reported at current densities of 1000, 100, 10, and 1 mu a/ cm/sup 2/ at ten degree intervals over the temperature range studied. (auth)

Research Organization:
Oregon. Univ., Eugene
DOE Contract Number:
AT(45-1)-535
NSA Number:
NSA-12-015319
OSTI ID:
4315076
Report Number(s):
AECU-3769
Resource Relation:
Other Information: Orig. Receipt Date: 31-DEC-58
Country of Publication:
United States
Language:
English