Cinematic reflectometry using QIKR, the quite intense kinetics reflectometer

Ankner, John F.; Ashkar, Rana; Browning, James F.; Charlton, Timothy R.; Doucet, Mathieu; Halbert, Candice E.; Islam, Fahima; Karim, Alamgir; Kharlampieva, Eugenia; Kilbey, II, Sidney Michael; Lin, Jiao Y. Y.; Phan, Minh D.; Smith, Gregory S.; Sukhishvili, Svetlana A.; Thermer, Rudolf; Veith, Gabriel M.; Watkins, Erik B.; Wilson, Danielle

doi:10.1063/5.0122279

Title: Cinematic reflectometry using QIKR, the quite intense kinetics reflectometer

Journal Article · Wed Jan 04 00:00:00 EST 2023 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0122279· OSTI ID:2001372

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Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
Univ. of Houston, TX (United States)
Univ. of Alabama, Birmingham, AL (United States)
Univ. of Tennessee, Knoxville, TN (United States)
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Univ. of Delaware, Newark, DE (United States)
Texas A & M Univ., College Station, TX (United States)
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)

The Quite Intense Kinetics Reflectometer (QIKR) will be a general-purpose, horizontal-sample-surface neutron reflectometer. Reflectometers measure the proportion of an incident probe beam reflected from a surface as a function of wavevector (momentum) transfer to infer the distribution and composition of matter near an interface. The unique scattering properties of neutrons make this technique especially useful in the study of soft matter, biomaterials, and materials used in energy storage. Exploiting the increased brilliance of the Spallation Neutron Source Second Target Station, QIKR will collect specular and off-specular reflectivity data faster than the best existing such machines. It will often be possible to collect complete specular reflectivity curves using a single instrument setting, enabling “cinematic” operation, wherein the user turns on the instrument and “films” the sample. Samples in time-dependent environments (e.g., temperature, electrochemical, or undergoing chemical alteration) will be observed in real time, in favorable cases with frame rates as fast as 1 Hz. Cinematic data acquisition promises to make time-dependent measurements routine, with time resolution specified during post-experiment data analysis. This capability will be deployed to observe such processes as in situ polymer diffusion, battery electrode charge–discharge cycles, hysteresis loops, and membrane protein insertion into lipid layers.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division (MSE); USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 2001372

Alternate ID(s):: OSTI ID: 1907904

Journal Information:: Review of Scientific Instruments, Vol. 94, Issue 1; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Title: Cinematic reflectometry using QIKR, the quite intense kinetics reflectometer

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