Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Sun, Ding; Shemyakin, Alexander

Title: Fast faraday cup for measuring the longitudinal distribution of particle charge density in non-relativistic beams

Patent · Tue Apr 18 00:00:00 EDT 2023

OSTI ID:1998310

Sun, Ding; Shemyakin, Alexander

A Fast Faraday Cup includes a group of electrodes including a grounded electrode having a through hole and a collector electrode configured with a blind hole that functions a collector hole. The electrodes are configured to allow a beam (e.g., a non-relativistic beam) to fall onto the grounded electrode so that the through hole cuts a beamlet that flies into the collector hole and facilitates measurement of the longitudinal distribution of particle charge density in the beam. The diameters, depths, spacing and alignment of the collector hole and the through hole are controllable to enable the Fast Faraday day cup to operate with a fast response time (e.g., fine time resolution) and capture secondary particles.

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Research Organization:: Fermi National Accelerator Laboratory (FNAL), Batavia, IL (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-07CH11359

Assignee:: Fermi Research Alliance, LLC (Batavia, IL)

Patent Number(s):: 11,630,132

Application Number:: 17/151,055

OSTI ID:: 1998310

Resource Relation:: Patent File Date: 01/15/2021

Country of Publication:: United States

Language:: English

References (23)

Faraday cup Hayafuji, Yoshinori https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/4608493 US Patent Document 4,608,493	patent	August 1986
Apparatus for ion beam fabrication Tomimatsu, Satoshi; Shichi, Hiroyasu; Kaneoka, Noriyuki https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080283778 US Patent Application 12/003207; 20080283778	patent-application	November 2008
Fast Faraday cup with high bandwidth Deibele, Craig E. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/7012419 US Patent Document 7,012,419	patent	March 2006
Modified Faraday cup Elmer, John W.; Teruya, Alan T.; O'Brien, Dennis https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5554926 US Patent Document 5,554,926	patent	September 1996
Beam imaging sensor and method for using same McAninch, Michael D.; Root, Jeffrey J. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9535100 US Patent Document 9,535,100	patent	January 2017
Electron Beam Profile Measurement System and Method with Optional Faraday Cup Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20130134323 US Patent Application 13/723269; 20130134323	patent-application	May 2013
Miniature Modified Faraday Cup for Micro Electron Beams Teruya, Alan T.; Elmer, John W.; Palmer, Todd A. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080088295 US Patent Application 11/166716; 20080088295	patent-application	April 2008
Use of ion induced luminescence (IIL) as feedback control for ion implantation Berry, Ivan L. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20080128621 US Patent Application 11/633694; 20080128621	patent-application	June 2008
Transducer Head System Camras, Marvin https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/3040124 US Patent Document 3040124	patent	June 1962
Faraday cup assembly and method of controlling the same Hwang, Sun-Ho https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20070080302 US Patent Application 11/544705; 20070080302	patent-application	April 2007
An improved design of Faraday cup detector to reduce the escape of secondary electrons in plasma focus device by COMSOL Roshani, G. H.; Habibi, M.; Sohrabi, M. Vacuum, Vol. 86, Issue 3 https://doi.org/10.1016/j.vacuum.2011.06.015	journal	October 2011
Design of a tapered stripline fast Faraday cup for measurements on heavy ion beams: problems and solutions Marcellini, F.; Poggi, M. The eighth beam instrumentation workshop, AIP Conference Proceedings https://doi.org/10.1063/1.57056	conference	January 1998
Stripline fast faraday cup for measuring GHz structure of ion beams Bogaty, John M. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/5103161 US Patent Document 5,103,161	patent	April 1992
Enhanced modified faraday cup for determination of power density distribution of electron beams Elmer, John W.; Teruya, Alan T. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/6300755 US Patent Document 6,300,755	patent	October 2001
Electron beam profile measurement system and method with optional Faraday cup Abgaryan, Artush A.; Levi, Eli; Leddy, Thomas https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8530851 US Patent Document 8,530,851	patent	September 2013
Fast Faraday cup to measure neutralized drift compression in intense ion charge bunches Sefkow, A.; Davidson, R.; Efthimion, P. Physical Review Special Topics - Accelerators and Beams, Vol. 9, Issue 5 https://doi.org/10.1103/PhysRevSTAB.9.052801	journal	May 2006
Electron Discharge Devices Using Electron-Bombarded Semiconductors Fischer, Paul; Richmond, Park; Wurthmann, Gunther E. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/3733510 US Patent Document 3733510	patent	May 1973
System and Method for Ion Implantation with Improved Productivity and Uniformity Vanderberg, Bo H.; Hayes, Steven C,; Ray, Andy https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20100308215 US Patent Application 12/796215; 20100308215	patent-application	December 2010
Fast faraday cup with high bandwidth Deibela, Craig E. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050212503 US Patent Application 10/810088; 20050212503	patent-application	September 2005
Integrated optical element and Faraday cup Knuffman, Brenton J.; Steele, Adam V.; McClelland, Jabez J. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8350556 US Patent Document 8,350,556	patent	January 2013
High density faraday cup array or other open trench structures and method of manufacture thereof Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8866081 US Patent Document 8,866,081	patent	October 2014
Faraday cup array integrated with a readout IC and method for manufacture thereof Bower, Christopher; Gilchrist, Kristin Hedgepath; Stoner, Brian R. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8866080 US Patent Document 8,866,080	patent	October 2014
Electron beam diagnostic for profiling high power beams Elmer, John W.; Palmer, Todd A.; Teruya, Alan T. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20050285047 US Patent Application 11/159978; 20050285047	patent-application	December 2005

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