Thermal conductivity evaluation of ion irradiated Si3N4 and ZrN ceramics using spatial domain thermoreflectance

Terricabras, Adrien J.; Ferrigno, Joshua; Wang, Ling; Khafizov, Marat; Nelson, Andrew T.; Zinkle, Steven J.

doi:10.1063/5.0099175

Title: Thermal conductivity evaluation of ion irradiated Si₃N₄ and ZrN ceramics using spatial domain thermoreflectance

Journal Article · Wed Aug 17 00:00:00 EDT 2022 · Journal of Applied Physics

DOI:https://doi.org/10.1063/5.0099175· OSTI ID:1905410

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Univ. of Tennessee, Knoxville, TN (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
The Ohio State Univ., Columbus, OH (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)

Nitride ceramics have been investigated for different applications in the nuclear industry, such as space nuclear power, fusion reactor diagnostics and plasma heating, inert matrix fuels, and accident tolerant fuels. Although thermal conductivity remains one of the most important properties to track following irradiation, traditional techniques such as laser flash and xenon flash are limited to bulk sample characterization, which requires lengthy and cost-consuming neutron irradiation. This work used spatial domain thermoreflectance (SDTR) for the micrometer-scale measurement of thermal conductivity in 15 MeV Ni ion-irradiated silicon nitride and zirconium nitride from 1 to 50 dpa and 300 to 700 °C. Here, the SDTR-measured unirradiated thermal conductivity was found to be consistent with the published data on bulk samples. Electrically conductive ZrN exhibits modest reduction after irradiation which is minimal at the highest irradiation temperatures. In electrically insulating Si₃N₄, the reduction is more significant and unlike ZrN, the reduction remains significant even at a higher irradiation temperature. The thermal resistance evolution following irradiation was compared with lattice swelling, which was determined using grazing incidence x-ray diffraction, and radiation-induced defects were observed using transmission electron microscopy. A saturation value was observed between 15 and 50 dpa for thermal conductivity degradation in both nitride ceramics and a direct correlation with high-temperature defect recombination was observed, as well as the potential presence of additional carrier scattering mechanisms.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1905410

Alternate ID(s):: OSTI ID: 1882008

Journal Information:: Journal of Applied Physics, Vol. 132, Issue 7; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Title: Thermal conductivity evaluation of ion irradiated Si₃N₄ and ZrN ceramics using spatial domain thermoreflectance