Implementation of a portable diagnostic system for Thomson scattering measurements on an electrothermal arc source

Conference · Tue Nov 01 00:00:00 EDT 2022

DOI:https://doi.org/10.1063/5.0101835· OSTI ID:1897848

He, Zichen ^[1]; Kafle, Nischal  ^[2]; Gebhart III, Trey ^[2]; Biewer, Theodore  ^[2]; Zhang, Zhili ^[2]

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1. University of Tennessee, Knoxville (UTK)
2. ORNL

To fulfill the increasing needs of diagnostic support for researchers in plasma technology, a portable diagnostic package (PDP) equipped for both laser Thomson scattering (TS) and optical emission spectroscopy has been designed and constructed at Oak Ridge National Laboratory (ORNL), aiming to measure the temperature and number density of electrons and temperatures of ions in plasma devices. The PDP has been initially implemented on a high density and low temperature electrothermal arc source (ET-arc) at ORNL to test its TS capability. TS from the plasmas in the ET-arc has been obtained using the PDP. The electron temperature and number density were determined from TS spectra. These results were then compared to measurements from previous studies on the ET-arc. The TS diagnostic measured 0.8 ± 0.1, 1.3 ± 0.2, and 0.7 ± 0.1 eV and (4.4 ± 0.5) × 1021, (5.9 ± 0.7) × 1021, and (4.3 ± 0.5) x 1021 m-3, respectively, from three lines of sight that transect the plasma column.

• Research Organization: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Advanced Research Projects Agency - Energy (ARPA-E)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1897848
• Resource Relation: Journal Volume: 93; Journal Issue: 11; Conference: High-Temperature Plasma Diagnostics (HTPD) - Rochester, New York, United States of America - 5/15/2022 8:00:00 AM-5/19/2022 8:00:00 AM
• Country of Publication: United States
• Language: English