Universal signal scaling in microwave impedance microscopy
- University of California, Berkeley, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- University of California, Berkeley, CA (United States)
Microwave impedance microscopy (MIM) is an emerging scanning probe technique that measures the local complex dielectric function using near-field microwave. Although it has made significant impacts in diverse fields, a systematic, quantitative understanding of the signal's dependence on various important design parameters is lacking. Here, we show that for a wide range of MIM implementations, given a complex tip-sample admittance change ΔΥ, the MIM signal—the amplified change in the reflected microwave amplitude—is –G · ΔΥ/2Υ0 · η2 · Vin, where η is the ratio of the microwave voltage at the probe to the incident microwave amplitude, Yo is the system admittance, and G is the total voltage gain. For linear circuits, η is determined by the circuit design and does not depend on Vin. We show that the maximum achievable signal for different designs scales with η2 or η when limited by input power or sample perturbation, respectively. Furthermore, this universal scaling provides guidance on diverse design goals, including maximizing narrow-band signal for imaging and balancing bandwidth and signal strength for spectroscopy.
- Research Organization:
- Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP); USDOE Laboratory Directed Research and Development (LDRD) Program
- Grant/Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1888295
- Alternate ID(s):
- OSTI ID: 1888597; OSTI ID: 1960235
- Journal Information:
- Applied Physics Letters, Vol. 121, Issue 12; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
Probing the edge states of Chern insulators using microwave impedance microscopy
Quantitative measurements of nanoscale permittivity and conductivity using tuning-fork-based microwave impedance microscopy
Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
Reflectometry
Signal-to-noise ratio
Radiowave and microwave technology
Signal processing
Dimensional analysis
Linear circuit
Microwave impedance microscopy
Tuning forks
Electronic circuits
Spectroscopy
reflectometry
signal-to-noise ratio
radiowave and microwave technology
signal processing
dimensional analysis
linear circuit
microwave impedance microscopy
tuning forks
electronic circuits
spectroscopy