A Square Pulse Thermoreflectance Technique for the Measurement of Thermal Properties

Wang, Yuzhou; Chauhan, Vinay; Hua, Zilong; Schley, Robert; Dennett, Cody A.; Murray, Daniel; Khafizov, Marat; Beausoleil, Geoffrey; Hurley, David H.

doi:10.1007/s10765-021-02949-z

Title: A Square Pulse Thermoreflectance Technique for the Measurement of Thermal Properties

Journal Article · Tue Feb 01 00:00:00 EST 2022 · International Journal of Thermophysics

DOI:https://doi.org/10.1007/s10765-021-02949-z· OSTI ID:1856860

^[1]; Chauhan, Vinay ^[2];

^[1];

^[1]; Khafizov, Marat ^[2];

^[1];

^[1]

Idaho National Lab. (INL), Idaho Falls, ID (United States)
The Ohio State Univ., Columbus, OH (United States)

We report on a laser-based square pulse thermoreflectance (SPTR) technique for the measurement of thermal properties for a wide range of materials. SPTR adopts the pump-probe thermoreflectance principle to monitor the evolution of local temperature after square pulse excitation. The technique features a compact setup, high spatial resolution, and fast data collection. By comparing the acquired SPTR signals with a continuum heat transfer model, material thermal properties can be obtained. Taking advantage of various spot sizes and modulation frequencies, SPTR can measure both the thermal diffusivity and thermal conductivity of poorly to moderately conductive materials and the thermal conductivity of conductive materials with satisfactory accuracy, with potential to be applied to more conductive materials. The technique was validated on three materials: fused silica, single crystal CaF2 and single crystal nickel (with conductivities ranging from 1 W·m^-1·K^-1 to 100 W·m^-1·K^-1) with typical measurement errors of 5 % to 20 %. The leading sources of error have been identified by Monte Carlo simulations, and the primary limitations of SPTR are discussed. The compact, fiberized platform we describe here will allow instruments based on this methodology to be deployed in complex, multi-analytical environments for the type of high-throughput correlative analyses that are key to materials design and discovery.

View Accepted Manuscript (DOE)

Cite

Export

Save

Research Organization:: Idaho National Lab. (INL), Idaho Falls, ID (United States)

Sponsoring Organization:: USDOE Office of Nuclear Energy (NE); USDOE Office of Science (SC)

Grant/Contract Number:: AC07-05ID14517

OSTI ID:: 1856860

Report Number(s):: INL/JOU-21-62086-Rev000; TRN: US2305160

Journal Information:: International Journal of Thermophysics, Vol. 43, Issue 4; ISSN 0195-928X

Publisher:: SpringerCopyright Statement

Country of Publication:: United States

Language:: English

References (49)

Measurement of the Kapitza resistance across a bicrystal interface Hurley, D. H.; Khafizov, M.; Shinde, S. L. Journal of Applied Physics, Vol. 109, Issue 8 https://doi.org/10.1063/1.3573511	journal	April 2011
Multiscale modeling of thermal conductivity of high burnup structures in UO2 fuels Bai, Xian-Ming; Tonks, Michael R.; Zhang, Yongfeng Journal of Nuclear Materials, Vol. 470 https://doi.org/10.1016/j.jnucmat.2015.12.028	journal	March 2016
Thermal conductivity imaging at micrometre-scale resolution for combinatorial studies of materials Huxtable, Scott; Cahill, David G.; Fauconnier, Vincent Nature Materials, Vol. 3, Issue 5 https://doi.org/10.1038/nmat1114	journal	April 2004
Ultralow Thermal Conductivity in Disordered, Layered WSe₂ Crystals Chiritescu, C.; Cahill, D. G.; Nguyen, N. Science, Vol. 315, Issue 5810, p. 351-353 https://doi.org/10.1126/science.1136494	journal	January 2007
Thin film nanocalorimeter for heat capacity measurements of 30 nm films Queen, D. R.; Hellman, F. Review of Scientific Instruments, Vol. 80, Issue 6 https://doi.org/10.1063/1.3142463	journal	June 2009
Local measurement of thermal conductivity and diffusivity Hurley, David H.; Schley, Robert S.; Khafizov, Marat Review of Scientific Instruments, Vol. 86, Issue 12 https://doi.org/10.1063/1.4936213	journal	December 2015
Current progress and future challenges in thermoelectric power generation: From materials to devices Liu, Weishu; Jie, Qing; Kim, Hee Seok Acta Materialia, Vol. 87 https://doi.org/10.1016/j.actamat.2014.12.042	journal	April 2015
Direct measurement of through-plane thermal conductivity and contact resistance in fuel cell materials Khandelwal, Manish; Mench, M. M. Journal of Power Sources, Vol. 161, Issue 2 https://doi.org/10.1016/j.jpowsour.2006.06.092	journal	October 2006
Analysis of heat flow in layered structures for time-domain thermoreflectance Cahill, David G. Review of Scientific Instruments, Vol. 75, Issue 12 https://doi.org/10.1063/1.1819431	journal	December 2004
High-throughput thermal conductivity measurements of nickel solid solutions and the applicability of the Wiedemann–Franz law Zheng, X.; Cahill, D.; Krasnochtchekov, P. Acta Materialia, Vol. 55, Issue 15 https://doi.org/10.1016/j.actamat.2007.05.037	journal	September 2007
Predicting interfacial thermal resistance by machine learning Wu, Yen-Ju; Fang, Lei; Xu, Yibin npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0193-0	journal	May 2019
Impact of irradiation induced dislocation loops on thermal conductivity in ceramics Khafizov, Marat; Pakarinen, Janne; He, Lingfeng Journal of the American Ceramic Society, Vol. 102, Issue 12 https://doi.org/10.1111/jace.16616	journal	June 2019
Ultrahigh thermal conductivity in isotope-enriched cubic boron nitride Chen, Ke; Song, Bai; Ravichandran, Navaneetha K. Science, Vol. 367, Issue 6477 https://doi.org/10.1126/science.aaz6149	journal	January 2020
Pulse accumulation, radial heat conduction, and anisotropic thermal conductivity in pump-probe transient thermoreflectance Schmidt, Aaron J.; Chen, Xiaoyuan; Chen, Gang Review of Scientific Instruments, Vol. 79, Issue 11 https://doi.org/10.1063/1.3006335	journal	November 2008
Bringing nuclear materials discovery and qualification into the 21st century Aguiar, Jeffery A.; Jokisaari, Andrea M.; Kerr, Matthew Nature Communications, Vol. 11, Issue 1 https://doi.org/10.1038/s41467-020-16406-2	journal	May 2020
Anisotropic thermal conductivity measurement using a new Asymmetric-Beam Time-Domain Thermoreflectance (AB-TDTR) method Li, Man; Kang, Joon Sang; Hu, Yongjie Review of Scientific Instruments, Vol. 89, Issue 8 https://doi.org/10.1063/1.5026028	journal	August 2018
Uncertainty analysis of thermoreflectance measurements Yang, Jia; Ziade, Elbara; Schmidt, Aaron J. Review of Scientific Instruments, Vol. 87, Issue 1 https://doi.org/10.1063/1.4939671	journal	January 2016
Optical Measurement of Thermal Conductivity Using Fiber Aligned Frequency Domain Thermoreflectance Malen, Jonathan A.; Baheti, Kanhayalal; Tong, Tao Journal of Heat Transfer, Vol. 133, Issue 8 https://doi.org/10.1115/1.4003545	journal	May 2011
Thermoreflectance technique to measure thermal effusivity distribution with high spatial resolution Hatori, Kimihito; Taketoshi, Naoyuki; Baba, Tetsuya Review of Scientific Instruments, Vol. 76, Issue 11 https://doi.org/10.1063/1.2130333	journal	November 2005
Measuring local thermal conductivity in polycrystalline diamond with a high resolution photothermal microscope Hartmann, J.; Voigt, P.; Reichling, M. Journal of Applied Physics, Vol. 81, Issue 7 https://doi.org/10.1063/1.364329	journal	April 1997
Comparison of the agglomeration behavior of thin metallic films on SiO2 Gadkari, P. R.; Warren, A. P.; Todi, R. M. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 23, Issue 4 https://doi.org/10.1116/1.1861943	journal	July 2005
Invited Article: Micron resolution spatially resolved measurement of heat capacity using dual-frequency time-domain thermoreflectance Wei, Changdong; Zheng, Xuan; Cahill, David G. Review of Scientific Instruments, Vol. 84, Issue 7 https://doi.org/10.1063/1.4815867	journal	July 2013
Simultaneous measurement of thermal conductivity and heat capacity of bulk and thin film materials using frequency-dependent transient thermoreflectance method Liu, Jun; Zhu, Jie; Tian, Miao Review of Scientific Instruments, Vol. 84, Issue 3 https://doi.org/10.1063/1.4797479	journal	March 2013
Influence of Inelastic Scattering at Metal-Dielectric Interfaces Hopkins, Patrick E.; Norris, Pamela M.; Stevens, Robert J. Journal of Heat Transfer, Vol. 130, Issue 2 https://doi.org/10.1115/1.2787025	journal	February 2008
Transient grating spectroscopy: An ultrarapid, nondestructive materials evaluation technique Hofmann, Felix; Short, Michael P.; Dennett, Cody A. MRS Bulletin, Vol. 44, Issue 5 https://doi.org/10.1557/mrs.2019.104	journal	May 2019
An improved transient plane source method for measuring thermal conductivity of thin films: Deconvoluting thermal contact resistance Ahadi, Mohammad; Andisheh-Tadbir, Mehdi; Tam, Mickey International Journal of Heat and Mass Transfer, Vol. 96 https://doi.org/10.1016/j.ijheatmasstransfer.2016.01.037	journal	May 2016
Anisotropic thermal conductivity tensor measurements using beam-offset frequency domain thermoreflectance (BO-FDTR) for materials lacking in-plane symmetry Tang, Lei; Dames, Chris International Journal of Heat and Mass Transfer, Vol. 164 https://doi.org/10.1016/j.ijheatmasstransfer.2020.120600	journal	January 2021
Investigation of thermal transport in composites and ion beam irradiated materials for nuclear energy applications Khafizov, M.; Chauhan, V.; Wang, Y. Journal of Materials Research, Vol. 32, Issue 1 https://doi.org/10.1557/jmr.2016.421	journal	December 2016
Thermal conductivity of thin metallic films measured by photothermal profile analysis Langer, G.; Hartmann, J.; Reichling, M. Review of Scientific Instruments, Vol. 68, Issue 3 https://doi.org/10.1063/1.1147638	journal	March 1997
Nanoscale thermal transport. II. 2003–2012 Cahill, David G.; Braun, Paul V.; Chen, Gang Applied Physics Reviews, Vol. 1, Issue 1 https://doi.org/10.1063/1.4832615	journal	March 2014
Measurement Techniques for Thermal Conductivity and Interfacial Thermal Conductance of Bulk and Thin Film Materials Zhao, Dongliang; Qian, Xin; Gu, Xiaokun Journal of Electronic Packaging, Vol. 138, Issue 4 https://doi.org/10.1115/1.4034605	journal	October 2016
The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement Hua, Zilong; Ban, Heng; Hurley, David H. Review of Scientific Instruments, Vol. 86, Issue 5 https://doi.org/10.1063/1.4919609	journal	May 2015
Characterization of thin metal films via frequency-domain thermoreflectance Schmidt, Aaron J.; Cheaito, Ramez; Chiesa, Matteo Journal of Applied Physics, Vol. 107, Issue 2 https://doi.org/10.1063/1.3289907	journal	January 2010
Measurement of thermal properties of bulk materials and thin films by modulated thermoreflectance (MTR) Fournier, D.; Marangolo, M.; Fretigny, C. Journal of Applied Physics, Vol. 128, Issue 24 https://doi.org/10.1063/5.0019025	journal	December 2020
Spatially resolved thermoreflectance techniques for thermal conductivity measurements from the nanoscale to the mesoscale Olson, David H.; Braun, Jeffrey L.; Hopkins, Patrick E. Journal of Applied Physics, Vol. 126, Issue 15 https://doi.org/10.1063/1.5120310	journal	October 2019
A steady-state thermoreflectance method to measure thermal conductivity Braun, Jeffrey L.; Olson, David H.; Gaskins, John T. Review of Scientific Instruments, Vol. 90, Issue 2 https://doi.org/10.1063/1.5056182	journal	February 2019
Determining local thermal transport in a composite uranium-nitride/silicide nuclear fuel using square-pulse transient thermoreflectance technique Middlemas, Scott; Hua, Zilong; Chauhan, Vinay Journal of Nuclear Materials, Vol. 528 https://doi.org/10.1016/j.jnucmat.2019.151842	journal	January 2020
New frontiers for the materials genome initiative de Pablo, Juan J.; Jackson, Nicholas E.; Webb, Michael A. npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0173-4	journal	April 2019
Time resolved imaging of carrier and thermal transport in silicon Hurley, D. H.; Wright, O. B.; Matsuda, O. Journal of Applied Physics, Vol. 107, Issue 2 https://doi.org/10.1063/1.3272827	journal	January 2010
A frequency-domain thermoreflectance method for the characterization of thermal properties Schmidt, Aaron J.; Cheaito, Ramez; Chiesa, Matteo Review of Scientific Instruments, Vol. 80, Issue 9 https://doi.org/10.1063/1.3212673	journal	September 2009
Improved apparatus for picosecond pump‐and‐probe optical measurements Capinski, William S.; Maris, Humphrey J. Review of Scientific Instruments, Vol. 67, Issue 8 https://doi.org/10.1063/1.1147100	journal	August 1996
Characterization of Kapitza resistances of natural grain boundaries in cerium oxide Hua, Zilong; Spackman, Jesse; Ban, Heng Materialia, Vol. 5 https://doi.org/10.1016/j.mtla.2019.100230	journal	March 2019
Reconsidering Uncertainty from Frequency Domain Thermoreflectance Measurement and Novel Data Analysis by Deep Learning Shen, Wenqing; Vaca, Diego; Kumar, Satish Nanoscale and Microscale Thermophysical Engineering, Vol. 24, Issue 3-4 https://doi.org/10.1080/15567265.2020.1807662	journal	August 2020
Crossover from incoherent to coherent phonon scattering in epitaxial oxide superlattices Ravichandran, Jayakanth; Yadav, Ajay K.; Cheaito, Ramez Nature Materials, Vol. 13, Issue 2 https://doi.org/10.1038/nmat3826	journal	December 2013
Abuse behavior of high-power, lithium-ion cells Spotnitz, R.; Franklin, J. Journal of Power Sources, Vol. 113, Issue 1 https://doi.org/10.1016/S0378-7753(02)00488-3	journal	January 2003
Characterization of ultralow thermal conductivity in anisotropic pyrolytic carbon coating for thermal management applications Wang, Yuzhou; Hurley, David H.; Luther, Erik P. Carbon, Vol. 129 https://doi.org/10.1016/j.carbon.2017.12.041	journal	April 2018
An overview of emerging hyphenated SEM-EDX and Raman spectroscopy systems: Applications in life, environmental and materials sciences Cardell, Carolina; Guerra, Isabel TrAC Trends in Analytical Chemistry, Vol. 77 https://doi.org/10.1016/j.trac.2015.12.001	journal	March 2016
Pump-probe measurements of the thermal conductivity tensor for materials lacking in-plane symmetry Feser, Joseph P.; Liu, Jun; Cahill, David G. Review of Scientific Instruments, Vol. 85, Issue 10 https://doi.org/10.1063/1.4897622	journal	October 2014
Laptop photothermal reflectance measurement instrument assembled with optical fiber components Yarai, Atsushi; Nakanishi, Takuji Review of Scientific Instruments, Vol. 78, Issue 5 https://doi.org/10.1063/1.2736414	journal	May 2007

Similar Records

MESOSCALE THERMAL TRANSPORT MEASUREMENTS OF MULTI-PHASE AND POROUS NUCLEAR FUELS USING A SQUARE-WAVE PULSE THERMOREFLECTANCE TECHNIQUE

Conference · Mon Jun 08 00:00:00 EDT 2020 · OSTI ID:1856860

Middlemas, Scott C; Hua, Zilong; Chauhan, Vinay; +5 more

Determining local thermal transport in a composite uranium-nitride/silicide nuclear fuel using square-pulse transient thermoreflectance technique

Journal Article · Sat Oct 12 00:00:00 EDT 2019 · Journal of Nuclear Materials · OSTI ID:1856860

Middlemas, Scott C; Hua, Zilong; Yorgason, William Tanner; +4 more

Thermal properties measurement of TRISO particle coatings from room temperature to 900 °C using laser-based thermoreflectance methods

Journal Article · Sat Apr 09 00:00:00 EDT 2022 · Journal of Nuclear Materials · OSTI ID:1856860

Wang, Yuzhou; Hua, Zilong; Schley, Robert S.; +2 more

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
thermal conductivity
thermoreflectance

Title: A Square Pulse Thermoreflectance Technique for the Measurement of Thermal Properties

Citation Formats

References (49)

Similar Records

Related Subjects