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Title: The amorphization of 3C-SiC irradiated at moderately elevated temperatures as revealed by X-ray diffraction

Journal Article · · Acta Materialia
 [1];  [2];  [3];  [4];  [4]
  1. Centre Européen de la Céramique, Limoges (France). Science des Procédés Céramiques et Traitements de Surface, CNRS UMR
  2. Univ. Paris-Sud, Orsay (France). Centre de Sciences Nucleaires et de Sciences de la Matiere (CSNSM); Université Paris-Saclay, Orsay (France)
  3. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Texas A & M Univ., College Station, TX (United States)
  4. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Mechanisms of radiation damage buildup in 3C-SiC remain poorly understood. Here, we use X-ray diffraction in combination with numerical simulations to study depth profiles of radiation-produced strain and lattice damage in 3C-SiC bombarded in the temperature range of 25–200 °C with 500 keV Ar ions. Results reveal increased defect recombination with increasing temperature, with a critical amorphization fluence increasing from 0.17 to 0.44 displacements per atom. The amorphization process is found to be correlated with the evolution of lattice strain. We find that, at fluences corresponding to the onset of amorphization, lattice strain is ~2% and is independent of temperature. With continuing bombardment above the onset of amorphization, the strain in the crystal bulk increases and reaches a saturation value that decreases from 7% to 5% with increasing temperature. Based on strain profiles, we compute depth profiles of the effective concentration of point defect clusters in the crystalline phase. Bombardment at higher temperatures results in lower maximum defect concentrations pointing to enhanced defect mobility.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC52-07NA27344
OSTI ID:
1840129
Alternate ID(s):
OSTI ID: 1549746
Report Number(s):
LLNL-JRNL-779360; 973036
Journal Information:
Acta Materialia, Vol. 140; ISSN 1359-6454
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 24 works
Citation information provided by
Web of Science

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Cited By (3)

Comparative study of radiation defect dynamics in 3C-SiC by X-ray diffraction, Raman scattering, and ion channeling journal December 2018
Strain engineering 4H-SiC with ion beams journal June 2019
Ionization-induced thermally activated defect-annealing process in SiC journal June 2019

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