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Title: Preface to the Proceedings of the 23rd Topical Conference on High-Temperature Plasma Diagnostics

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0063410· OSTI ID:1812685

Measurements of phenomena advance our understanding of the physical universe. As our understanding grows, more precise measurements are required, as are measurements of new quantities. Diagnosis of a plasma requires developing new instruments, also called diagnostics, as well as new ways to analyze, interpret, synthesize, and correlate their measurements. Further, as computing power increases and multi-physics codes improve their accuracy, more precise measurements are needed to guide future code developments and to validate predictions of these simulation codes. The Topical Conference on High-Temperature Plasma Diagnostics is focused on presenting and documenting the most recent advances in these instrumentation areas for plasmas. The 23rd occurrence of this biennial conference took place on December 14–17, 2020, and was hosted by Los Alamos National Laboratory. Originally scheduled for June 2020 in Santa Fe, New Mexico, the conference was postponed and then held virtually due to the global COVID-19 pandemic. Conference times were adjusted and presentations were scheduled to meet the needs of attendees in Europe, the USA, and Asia.

Research Organization:
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
89233218CNA000001
OSTI ID:
1812685
Report Number(s):
LA-UR-21-26609; TRN: US2213273
Journal Information:
Review of Scientific Instruments, Vol. 92, Issue 8; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English