Effect of rapid thermal annealing of copper indium aluminium gallium diselenide solar cell devices and its deposition challenges
- Univ. of Minnesota, Minneapolis, MN (United States)
- Rose-Hulman Inst. of Technology, Terre Haute, IN (United States)
Thin-film photovoltaic research based on ternary or quaternary absorber materials has mainly concentrated on copper (indium/gallium) diselenide, CuInxGa1-xSe2 (CIGS). This material has demonstrated exceptional energy conversion efficiencies. By altering the In/Ga ratio the band gap can be varied from 1.02 eV (for CuInSe2) to 1.68 eV (for CuGaSe2). However, research from leading groups showed that cells have maximum efficiency at or below 1.35 eV. This paper reports the challenges of using aluminium alloyed CIGS deposited with a single step co-evaporation method. Adding aluminium is found to reduce the bulk trap state density for wide gap devices. However, it created significant safety issues when compared to conventional CIGS co-evaporation deposition systems. The release of H2Se when moisture comes in contact with aluminium selenide was resolved by placing exhaust lines at various places of the deposition chamber. A single phase CIAGS device with a bandgap of 1.30 eV was prepared using a co-evaporation method. The fabricated solar cell devices with CIAGS absorber layers and resulted in a photoconversion efficiency of 10.3%. A progressive rapid thermal annealing at various temperature resulted in a 10% increase in the overall efficiency at 300 °C. The efficiencies were reduced when the RTA temperature increased above 300 °C.
- Research Organization:
- Univ. of Minnesota, Minneapolis, MN (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- Grant/Contract Number:
- EE0005319
- OSTI ID:
- 1799173
- Alternate ID(s):
- OSTI ID: 1532590
- Journal Information:
- Applied Surface Science, Vol. 493; ISSN 0169-4332
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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