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Title: Direct Optoelectronic Imaging of 2D Semiconductor–3D Metal Buried Interfaces

Journal Article · · ACS Nano
ORCiD logo [1]; ORCiD logo [1];  [2];  [1];  [1];  [3]; ORCiD logo [1];  [4]; ORCiD logo [5];  [1]; ORCiD logo [1]; ORCiD logo [6]; ORCiD logo [1]
  1. Univ. of Pennsylvania, Philadelphia, PA (United States)
  2. Villanova Univ., PA (United States)
  3. Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States); UES Inc., Beavercreek, OH (United States)
  4. Brookhaven National Lab. (BNL), Upton, NY (United States)
  5. Univ. of Dayton, OH (United States)
  6. Air Force Research Lab. (AFRL), Wright-Patterson AFB, OH (United States)

The semiconductor-metal junction is one of the most critical factors for high performance electronic devices. In two-dimensional (2D) semiconductor devices, minimizing voltage drop at this junction is of particularly challenging and important. Despite numerous studies on contact resistance in 2D semiconductors, the exact nature of the buried interface under a 3D metal remains elusive and unclear. Herein, we report the direct observation of 2D semiconductor-metal buried interface using recently developed metal-assisted transfer technique to expose the buried interface which is then directly investigated using scanning probe techniques. We characterize the spatially varying electronic and optical properties of this buried interface with < 20 nm resolution. To be specific, potential, conductance and photoluminescence at the buried metal/MoS2 interface are correlated under variety of metal deposition conditions as well as type of metal contacts. We observe that direct evaporation of Au on MoS2 induces large strain of ~5% in the MoS2 which coupled with charge transfer leads to degenerate doping of the MoS2 underneath the contact. These factors lead to improvement of contact resistance to record values of 138 kΩ μm measured using local conductance probes. This approach was adopted to investigate MoS2-In/Au alloy interface, which records lowest contact resistance of 63 kΩ μm. Overall, our results highlight that the MoS2/Metal interface is very sensitive to method of contact making and provides a universal strategy to characterize buried contact interfaces involving 2D semiconductors.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); US Air Force Office of Scientific Research (AFOSR); US Army Research Office (ARO); National Science Foundation (NSF); Swiss National Science Foundation (SNSF)
Grant/Contract Number:
SC0012704; FA9550-21-1-003; W911NF-19-1-010; FA2386-20-1-4074; DMR-1905853; DMR-1720530; NNCI-1542153; 187977; FA9550-19RYCOR050
OSTI ID:
1785940
Report Number(s):
BNL-221562-2021-JAAM
Journal Information:
ACS Nano, Vol. 15, Issue 3; ISSN 1936-0851
Publisher:
American Chemical Society (ACS)Copyright Statement
Country of Publication:
United States
Language:
English

References (68)

Fermi-level pinning and charge neutrality level in germanium journal December 2006
Photoreflectance study of the surface Fermi level at (001) n ‐ and p ‐type GaAs surfaces journal January 1992
Determination of the Fermi-level pinning position at Si(111) surfaces journal December 1983
Van der Waals Materials for Atomically-Thin Photovoltaics: Promise and Outlook journal November 2017
Emerging photonic architectures in two-dimensional opto-electronics journal January 2018
Electrical contacts to two-dimensional semiconductors journal November 2015
Contacts between Two- and Three-Dimensional Materials: Ohmic, Schottky, and pn Heterojunctions journal May 2016
Contact engineering for 2D materials and devices journal January 2018
Improved Contacts to MoS 2 Transistors by Ultra-High Vacuum Metal Deposition journal May 2016
Approaching the Schottky–Mott limit in van der Waals metal–semiconductor junctions journal May 2018
Van der Waals contacts between three-dimensional metals and two-dimensional semiconductors journal March 2019
The chemistry of two-dimensional layered transition metal dichalcogenide nanosheets journal April 2013
Phase-engineered low-resistance contacts for ultrathin MoS2 transistors journal August 2014
Covalent functionalization of monolayered transition metal dichalcogenides by phase engineering journal November 2014
Phase patterning for ohmic homojunction contact in MoTe2 journal August 2015
Atomic mechanism of the semiconducting-to-metallic phase transition in single-layered MoS2 journal April 2014
Uncovering the Effects of Metal Contacts on Monolayer MoS 2 journal September 2020
Probing Evolution of Local Strain at MoS 2 -Metal Boundaries by Surface-Enhanced Raman Scattering journal October 2018
Nano-optical imaging and spectroscopy of order, phases, and domains in complex solids journal December 2012
Nanoscale Heterogeneities in Monolayer MoSe 2 Revealed by Correlated Scanning Probe Microscopy and Tip-Enhanced Raman Spectroscopy journal January 2018
Hybrid Tip-Enhanced Nanospectroscopy and Nanoimaging of Monolayer WSe 2 with Local Strain Control journal March 2016
Dry Transfer of van der Waals Crystals to Noble Metal Surfaces To Enable Characterization of Buried Interfaces journal September 2019
A new insight for ohmic contacts to MoS 2 : by tuning MoS 2 affinity energies but not metal work-functions journal January 2017
Atomically Thin MoS2 A New Direct-Gap Semiconductor journal September 2010
Emerging Photoluminescence in Monolayer MoS2 journal April 2010
Photonic crystallization of two-dimensional MoS 2 for stretchable photodetectors journal January 2019
Highly Localized Strain in a MoS 2 /Au Heterostructure Revealed by Tip-Enhanced Raman Spectroscopy journal September 2017
Giant gap-plasmon tip-enhanced Raman scattering of MoS 2 monolayers on Au nanocluster arrays journal January 2018
Shape-Uniform, High-Quality Monolayered MoS 2 Crystals for Gate-Tunable Photoluminescence journal November 2017
Control of Plasmon Emission and Dynamics at the Transition from Classical to Quantum Coupling journal August 2014
Improving resolution in quantum subnanometre-gap tip-enhanced Raman nanoimaging journal May 2016
Symmetry-dependent phonon renormalization in monolayer MoS 2 transistor journal April 2012
Gate-Tunable Resonant Raman Spectroscopy of Bilayer MoS 2 journal June 2017
Probing Local Strain at MX 2 –Metal Boundaries with Surface Plasmon-Enhanced Raman Scattering journal August 2014
Mastering high resolution tip-enhanced Raman spectroscopy: towards a shift of perception journal January 2017
Quantum mechanical effects in plasmonic structures with subnanometre gaps journal June 2016
Plasmonic Gradient Effects on High Vacuum Tip-Enhanced Raman Spectroscopy journal November 2013
Optical Origin of Subnanometer Resolution in Tip-Enhanced Raman Mapping journal May 2015
Molecular cavity optomechanics as a theory of plasmon-enhanced Raman scattering journal November 2015
Quantum Mechanical Description of Raman Scattering from Molecules in Plasmonic Cavities journal May 2016
Direct Experimental Evidence of Hot Carrier-Driven Chemical Processes in Tip-Enhanced Raman Spectroscopy (TERS) journal December 2019
A Closer Look at Corrugated Au Tips journal February 2020
Suppressing Molecular Charging, Nanochemistry, and Optical Rectification in the Tip-Enhanced Raman Geometry journal July 2020
Plasmon–phonon coupling in monolayer WS 2 journal March 2016
Bandgap Engineering of Strained Monolayer and Bilayer MoS2 journal July 2013
The disorder-induced Raman scattering in Au/MoS 2 heterostructures journal July 2015
Gram-Scale Aqueous Synthesis of Stable Few-Layered 1T-MoS 2 : Applications for Visible-Light-Driven Photocatalytic Hydrogen Evolution journal August 2015
Pure and stable metallic phase molybdenum disulfide nanosheets for hydrogen evolution reaction journal February 2016
Work function variation of MoS 2 atomic layers grown with chemical vapor deposition: The effects of thickness and the adsorption of water/oxygen molecules journal June 2015
Designing Electrical Contacts to MoS 2 Monolayers: A Computational Study journal April 2012
Band-like transport in high mobility unencapsulated single-layer MoS 2 transistors journal April 2013
Recommended values of clean metal surface work functions
  • Derry, Gregory N.; Kern, Megan E.; Worth, Eli H.
  • Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, Vol. 33, Issue 6 https://doi.org/10.1116/1.4934685
journal November 2015
Layer dependence of the electronic band alignment of few-layer Mo S 2 on Si O 2 measured using photoemission electron microscopy journal June 2017
Tunable phase stability and contact resistance of monolayer transition metal dichalcogenides contacts with metal journal May 2018
Controlling the Schottky barrier at MoS 2 /metal contacts by inserting a BN monolayer journal April 2015
Low-Temperature Ohmic Contact to Monolayer MoS 2 by van der Waals Bonded Co/ h -BN Electrodes journal July 2017
Ohmic Contacts to 2D Semiconductors through van der Waals Bonding journal February 2016
Band alignment of two-dimensional h-BN/MoS2 van der Waals heterojunction measured by X-ray photoelectron spectroscopy journal September 2020
Origins of genuine Ohmic van der Waals contact between indium and MoS2 journal January 2021
The work function of the elements and its periodicity journal November 1977
Mechanically modulated tunneling resistance in monolayer MoS 2 journal October 2013
Stretching and Breaking of Ultrathin MoS 2 journal November 2011
Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness journal July 2006
Efficient iterative schemes for ab initio total-energy calculations using a plane-wave basis set journal October 1996
Fully unconstrained noncollinear magnetism within the projector augmented-wave method journal November 2000
From ultrasoft pseudopotentials to the projector augmented-wave method journal January 1999
Generalized Gradient Approximation Made Simple journal October 1996
Ohmic contacts to 2D semiconductors through van der Waals bonding text January 2016