Approaching the Practical Conductivity Limits of Aerosol Jet Printed Silver

Rosker, Eva S.; Barako, Michael T.; Nguyen, Evan; DiMarzio, Don; Kisslinger, Kim; Duan, Dah-Weih; Sandhu, Rajinder; Goorsky, Mark S.; Tice, Jesse

doi:10.1021/acsami.0c06959

Title: Approaching the Practical Conductivity Limits of Aerosol Jet Printed Silver

Journal Article · Thu Jun 04 00:00:00 EDT 2020 · ACS Applied Materials and Interfaces

DOI:https://doi.org/10.1021/acsami.0c06959· OSTI ID:1661639

^[1]; Barako, Michael T. ^[2]; Nguyen, Evan ^[2]; DiMarzio, Don ^[3];

^[4]; Duan, Dah-Weih ^[2]; Sandhu, Rajinder ^[2]; Goorsky, Mark S. ^[5]; Tice, Jesse ^[2]

Northrop Grumman Corporation, Redondo Beach, CA (United States); Univ. of California, Los Angeles, CA (United States)
Northrop Grumman Corporation, Redondo Beach, CA (United States)
Northrop Grumman Corporation, Redondo Beach, CA (United States); Brookhaven National Lab. (BNL), Upton, NY (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Univ. of California, Los Angeles, CA (United States)

Previous efforts to directly write conductive metals have been narrowly focused on nanoparticle ink suspensions that require aggressive sintering (>200°C) and result in low-density, small-grained agglomerates with electrical conductivities <25% of bulk metal. Here, we demonstrate aerosol jet printing of a reactive ink solution and characterize high-density (93%) printed silver traces having near-bulk conductivity and grain sizes greater than the electron mean free path, while only requiring low temperature (80°C) treatment. We have developed a predictive electronic transport model which correlates the microstructure to the measured conductivity and identifies a strategy to approach the practical conductivity limit for printed metals. Our analysis of how grain boundaries and tortuosity contribute to electrical resistivity provides insight into the basic materials science that governs how an ink formulator or process developer might approach improving the conductivity. Transmission line measurements validate that electrical properties are preserved up to 20GHz, which demonstrates the utility of this technique for printed RF components. Finally, this work reveals a new method of producing robust printed electronics that retain the advantages of rapid prototyping and three-dimensional fabrication while achieving the performance necessary for success within the aerospace and communications industries.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division

Grant/Contract Number:: SC0012704

OSTI ID:: 1661639

Report Number(s):: BNL-217530-2020-JAAM

Journal Information:: ACS Applied Materials and Interfaces, Vol. 12, Issue 26; ISSN 1944-8244

Publisher:: American Chemical Society (ACS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 16 works

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77 NANOSCIENCE AND NANOTECHNOLOGY
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