Evidence for trap-assisted Auger recombination in MBE grown InGaN quantum wells by electron emission spectroscopy

Myers, Daniel J.; Espenlaub, Andrew C.; Gelzinyte, Kristina; Young, Erin C.; Martinelli, Lucio; Peretti, Jacques; Weisbuch, Claude; Speck, James S.

doi:10.1063/1.5125605

Title: Evidence for trap-assisted Auger recombination in MBE grown InGaN quantum wells by electron emission spectroscopy

Journal Article · Mon Mar 02 00:00:00 EST 2020 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.5125605· OSTI ID:1635222

^[1];

^[2];

^[1]; Martinelli, Lucio ^[3]; Peretti, Jacques ^[3]; Weisbuch, Claude ^[4]; Speck, James S. ^[1]

Univ. of California, Santa Barbara, CA (United States)
Vilnius Univ. (Lithuania)
Ecole Polytechnique, Palaiseau Cedex (France)
Univ. of California, Santa Barbara, CA (United States); Ecole Polytechnique, Palaiseau Cedex (France)

We report on the direct measurement of hot electrons generated in the active region of blue light-emitting diodes grown by ammonia molecular beam epitaxy by electron emission spectroscopy. The external quantum efficiency of these devices is <1% and does not droop; thus, the efficiency losses from the intrinsic, interband, electron-electron-hole, or electron-hole-hole Auger should not be a significant source of hot carriers. Here, the detection of hot electrons in this case suggests that an alternate hot electron generating process is occurring within these devices, likely a trap-assisted Auger recombination process.

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Research Organization:: Univ. of California, Santa Barbara, CA (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Energy Efficiency Office. Building Technologies Office

Contributing Organization:: Ecole Polytechnique Paris Vilnius University

Grant/Contract Number:: EE0007096

OSTI ID:: 1635222

Alternate ID(s):: OSTI ID: 1602582

Journal Information:: Applied Physics Letters, Vol. 116, Issue 9; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 21 works

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References (31)

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Title: Evidence for trap-assisted Auger recombination in MBE grown InGaN quantum wells by electron emission spectroscopy

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