Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA
- Univ. of Rochester, NY (United States). Lab. for Laser Energetics
A method was developed with laser-irradiated Au planar foils to characterize the focal spot of UV laser beams on target at full energy from soft x-ray emission. A pinhole camera with a back-thinned charge-coupled–device detector and filtration with thin Be and Al foil filters provides images of the x-ray emission at photon energies <2 keV. This method requires a careful measurement of the relation between the applied UV fluence and the x-ray signal, which can be described by a power-law dependence. The measured exponent γ ~ 2 provides a dynamic range of ~25 for the inferred UV fluence. UV fluence profiles of selected beams were measured for 100-ps and 1-ns laser pulses and were compared to directly measured profiles from an UV equivalent-target-plane diagnostic. The inferred spot size and super-Gaussian order from the x-ray technique agree within several percent with the values measured with the direct UV measurements.
- Research Organization:
- Univ. of Rochester, NY (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- NA0003856
- OSTI ID:
- 1598519
- Alternate ID(s):
- OSTI ID: 1597538
- Report Number(s):
- 2019-242; 1548; 2505; 2019-242, 1548, 2505; TRN: US2103300
- Journal Information:
- Review of Scientific Instruments, Vol. 91, Issue 2; ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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