Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy

Idrobo, Juan Carlos; Lupini, Andrew R.; Feng, Tianli; Unocic, Raymond R.; Walden, Franklin S.; Gardiner, Daniel S.; Lovejoy, Tracy C.; Dellby, Niklas; Pantelides, Sokrates T.; Krivanek, Ondrej L.

doi:10.1103/PhysRevLett.120.095901

Title: Temperature Measurement by a Nanoscale Electron Probe Using Energy Gain and Loss Spectroscopy

Journal Article · Fri Mar 02 00:00:00 EST 2018 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.120.095901· OSTI ID:1597878

Idrobo, Juan Carlos ^[1]; Lupini, Andrew R. ^[2]; Feng, Tianli ^[3]; Unocic, Raymond R. ^[1]; Walden, Franklin S. ^[4]; Gardiner, Daniel S. ^[4]; Lovejoy, Tracy C. ^[5]; Dellby, Niklas ^[5]; Pantelides, Sokrates T. ^[3]; Krivanek, Ondrej L. ^[5]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Vanderbilt Univ., Nashville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Protochips Company, Morrisville, NC (United States)
Nion Company, Kirkland, WA (United States)

Heat dissipation in integrated nanoscale devices is a major issue that requires the development of nanoscale temperature probes. In this paper, we report the implementation of a method that combines electron energy gain and loss spectroscopy to provide a direct measurement of the local temperature in the nanoenvironment. Loss and gain peaks corresponding to an optical-phonon mode in boron nitride were measured from room temperature to ~1600 K. Both loss and gain peaks exhibit a shift towards lower energies as the sample is heated up. First-principles calculations of the temperature-induced phonon frequency shifts provide insights into the origin of this effect and confirm the experimental data. The experiments and theory presented here open the doors to the study of anharmonic effects in materials by directly probing phonons in the electron microscope.

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Research Organization:: Vanderbilt Univ., Nashville, TN (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States). National Energy Research Scientific Computing Center (NERSC); Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; McMinn Endowment; USDOE

Grant/Contract Number:: FG02-09ER46554; AC02-05CH11231; AC05-00OR22725

OSTI ID:: 1597878

Alternate ID(s):: OSTI ID: 1423505; OSTI ID: 1544311; OSTI ID: 1784204

Journal Information:: Physical Review Letters, Vol. 120, Issue 9; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 80 works

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Measuring nanoscale thermal gradients in suspended MoS ₂ with STEM-EELS Shen, Lang; Mecklenburg, Matthew; Dhall, Rohan Applied Physics Letters, Vol. 115, Issue 15 https://doi.org/10.1063/1.5094443	journal	October 2019
Measuring temperature-dependent thermal diffuse scattering using scanning transmission electron microscopy Wehmeyer, Geoff; Bustillo, Karen C.; Minor, Andrew M. Applied Physics Letters, Vol. 113, Issue 25 https://doi.org/10.1063/1.5066111	journal	December 2018
Modeling ballistic phonon transport from a cylindrical electron beam heat source Wehmeyer, Geoff Journal of Applied Physics, Vol. 126, Issue 12 https://doi.org/10.1063/1.5115165	journal	September 2019
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