Steady-state photoluminescent excitation characterization of semiconductor carrier recombination

Bhosale, J. S.; Moore, J. E.; Wang, X.; Bermel, P.; Lundstrom, M. S.

doi:10.1063/1.4939047

Title: Steady-state photoluminescent excitation characterization of semiconductor carrier recombination

Journal Article · Thu Jan 14 00:00:00 EST 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4939047· OSTI ID:1579853

Bhosale, J. S. ^[1]; Moore, J. E. ^[2]; Wang, X. ^[2];

^[2];

^[2]

Intel Corporation, Hillsboro, OR (United States); Purdue Univ., West Lafayette, IN (United States)
Purdue Univ., West Lafayette, IN (United States)

We report that photoluminescence excitation spectroscopy is a contactless characterization technique that can provide valuable information about the surface and bulk recombination parameters of a semiconductor device, distinct from other sorts of photoluminescent measurements. For this technique, a temperature-tuned light emitting diode (LED) has several advantages over other light sources. The large radiation density offered by LEDs from near-infrared to ultraviolet region at a low cost enables efcient and fast photoluminescence measurements. A simple and inexpensive LED-based setup facilitates measurement of surface recombination velocity and bulk Shockley-Read-Hall lifetime, which are key parameters to assess device performance. Finally, under the right conditions, this technique can also provide a contactless way to measure the external quantum efciency of a solar cell

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Research Organization:: Stanford Univ., CA (United States)

Sponsoring Organization:: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office

Grant/Contract Number:: EE0004946; AC36-08GO28308

OSTI ID:: 1579853

Journal Information:: Review of Scientific Instruments, Vol. 87, Issue 1; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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References (23)

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