Single-Event Characterization of 16 nm FinFET Xilinx UltraScale+ Field-Programmable Gate Array and Multi-Processor System-on-Chip Devices with Heavy Ion and Neutron Irradiation.
Conference
·
OSTI ID:1513704
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1513704
- Report Number(s):
- SAND2018-1112C; 660406
- Resource Relation:
- Conference: Proposed for presentation at the IEEE Nuclear and Space Radiation Effects Conference held July 16-20, 2018 in Kona, HI.
- Country of Publication:
- United States
- Language:
- English
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