The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation

Hau-Riege, Stefan P.; Pardini, Tom

doi:10.1063/1.4996190

Title: The effect of electron transport on the characterization of x-ray free-electron laser pulses via ablation

Journal Article · Tue Oct 03 00:00:00 EDT 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4996190· OSTI ID:1512632

Hau-Riege, Stefan P. ^[1]; Pardini, Tom ^[1]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

The spatial intensity distribution of x-ray free-electron laser (XFEL) pulses in-focus is commonly characterized by performing ablative imprints in thin gold films on silica substrates. In many cases, the range of the electrons generated in the gold by x-ray absorption far exceeds the beam size, and so, it is not clear if the results of imprint studies are compromised by electron transport. Thermal conduction could further modify the energy density profile in the material. We used here a combination of Monte-Carlo transport and continuum models to quantify the accuracy of the imprint method for characterizing XFEL beam profiles. We found that for x-ray energies in the range of 1 to 10 keV, the actual and the measured beam diameters agree within 12% or better for beam diameters between 0.1 and 1 μm.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1512632

Report Number(s):: LLNL-JRNL-733619; 885501

Journal Information:: Applied Physics Letters, Vol. 111, Issue 14; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 2 works

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