Electron beam masks for compressive sensors

Stevens, Andrew J.; Kovarik, Libor; Browning, Nigel D.; Liyu, Andrey V.

Title: Electron beam masks for compressive sensors

Patent · Tue Oct 23 00:00:00 EDT 2018

OSTI ID:1490037

Stevens, Andrew J.; Kovarik, Libor; Browning, Nigel D.; Liyu, Andrey V.

Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.

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Research Organization:: Battelle Memorial Institute, Richland, WA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-03ER46057; AC05-76RL01830

Assignee:: Battelle Memorial Institute (Richland, WA)

Patent Number(s):: 10,109,453

Application Number:: 15/075,031

OSTI ID:: 1490037

Resource Relation:: Patent File Date: 2016 Mar 18

Country of Publication:: United States

Language:: English

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High-speed multiframe dynamic transmission electron microscope image acquisition system with arbitrary timing Reed, Bryan W.; DeHope, William J.; Huete, Glenn https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/9165743 US Patent Document 9,165,743	patent	October 2015
Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy Saghi, Zineb; Benning, Martin; Leary, Rowan Advanced Structural and Chemical Imaging, Vol. 1, Issue 1 https://doi.org/10.1186/s40679-015-0007-5	journal	May 2015
Sparse Sampling And Reconstruction For Electron And Scanning Probe Microscope Imaging Anderson, Hyrum; Helms, Jovana; Wheeler, Jason https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150069233 US Patent Application 14/482754; 20150069233	patent-application	March 2015
$rm K$-SVD: An Algorithm for Designing Overcomplete Dictionaries for Sparse Representation Aharon, M.; Elad, M.; Bruckstein, A. IEEE Transactions on Signal Processing, Vol. 54, Issue 11 https://doi.org/10.1109/TSP.2006.881199	journal	November 2006
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Method Of Examining A Sample In A Charged-Particle Microscope Lazic, Ivan; Bosch, Eric; Boughorbel, Faysal https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/20150243474 US Patent Application 14/629387; 20150243474	patent-application	August 2015
Image resolution and sensitivity in an environmental transmission electron microscope Jinschek, J. R.; Helveg, S. Micron, Vol. 43, Issue 11 https://doi.org/10.1016/j.micron.2012.01.006	journal	November 2012
Method and apparatus for compressive domain filtering and interference cancellation Davenport, Mark A.; Boufounos, Petros; Baraniuk, Richard G. https://doi.org/https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8725784 US Patent Document 8,725,784	patent	May 2014

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