Performance of quartz- and sapphire-based double-crystal high-resolution (~10 meV) RIXS monochromators under varying power loads
- Argonne National Lab. (ANL), Lemont, IL (United States)
- Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
- Max-Planck-Institut fuer Festkoerperforschung, Stuttgart (Germany)
In the context of a novel, high-resolution resonant inelastic X-ray scattering spectrometer, a flat-crystal-based quartz analyzer system has recently been demonstrated to provide an unprecedented intrinsic-energy resolution of 3.9 meV at the IrL3 absorption edge (11.215 keV) [Kimet al.(2018)Sci. Rep.8, 1958]. However, the overall instrument resolution was limited to 9.7 meV because of an 8.9 meV incident band pass, generated by the available high-resolution four-bounce Si(844) monochromator. In order to better match the potent resolving power of the novel analyzer with the energy band pass of the incident beam, a quartz(309)-based double-bounce, high-resolution monochromator was designed and implemented, expected to yield an overall instrument resolution of 6.0 meV. The choice of lower-symmetry quartz is very attractive because of its wealth of suitable near-backscattering reflections. However, it was found that during room-temperature operation typical levels of incident power, barely affecting the Si monochromator, caused substantial thermal distortions in the first crystal of the quartz monochromator, rendering it practically unusable. Finite-element analyses and heat-flow analyses corroborate this finding. As a high-flux, lower resolution (15.8 meV) alternative, a two-bounce sapphire(078) version was also tested and found to be less affected than quartz, but notably more than silicon.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1473620
- Journal Information:
- Journal of Synchrotron Radiation (Online), Vol. 25, Issue 4; ISSN 1600-5775
- Publisher:
- International Union of CrystallographyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering?
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journal | October 2019 |
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