Extending the Aspect Ratio of Etched Silicon for Precision Electro-coating with Gold to Fabricate XPCI Analyzer Gratings.

Conference · Fri Sep 01 00:00:00 EDT 2017

OSTI ID:1470919

Finnegan, Patrick Sean; Arrington, Christian Lew; Coleman, Jonathan Joseph; Dagel, Amber Lynn; Hollowell, Andrew E; Perez, Carlos

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1470919
• Report Number(s): SAND2017-9659C; 656859
• Resource Relation: Conference: Proposed for presentation at the XNPIG Conference Zurich 2017 held September 12-15, 2017 in Zurich, Switzerland.
• Country of Publication: United States
• Language: English