X-ray magnetic circular dichroism and near-edge X-ray absorption fine structure of buried interfacial magnetism measured by using a scanning tunneling microscope tip
- Argonne National Lab. (ANL), Argonne, IL (United States); Ohio Univ., Athens, OH (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Harvard Univ., Cambridge, MA (United States)
- Ohio Univ., Athens, OH (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Magnetism at buried interfaces plays a crucial role in many emerging phenomena, but detection of interfacial magnetism in close proximity to a surface with elemental and chemical sensitivity is a challenging task. Here, we use a low temperature synchrotron x-ray scanning tunneling microscopy to investigate x-ray magnetic circular dichroism and near edge x-ray absorption fine structure of La0.67Sr0.33MnO3-LaNiO3 superlattices in the absence of a magnetic field. In stark contrast to the weak magnetic signal of Mn when the La0.67Sr0.33MnO3 layers are located on top, a robust x-ray magnetic circular dichroism signal is detected when they are buried underneath the LaNiO3 layers. The near edge x-ray absorption fine structure reveals the valence states of the manganese while the oxygen K- edge x-ray absorption spectra show an increase in hole formation indicating a cogent charge transfer at the LaNiO3/La0.67Sr0.33MnO3 interface. This work demonstrates that scanning tunneling microscopy can be extended to the synchrotron X-ray study of buried interfaces by controlling the sample-tip (e.g., detector) separation in the nanometer regime. The close sample-tip proximity further provides a path toward probing of small lateral areas with zero-field measurements in multi-domain samples.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division; USDOE
- Grant/Contract Number:
- AC02-06CH11357; SC70705; FG02-02ER46012
- OSTI ID:
- 1465772
- Alternate ID(s):
- OSTI ID: 1463221
- Journal Information:
- Applied Physics Letters, Vol. 113, Issue 6; ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3
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journal | November 2019 |
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