Note: Narrow x-ray reflections are easier to locate with sandpaper
Journal Article
·
· Review of Scientific Instruments
Here, synchrotrons can provide almost perfectly unidirectional and monochromatic x-rays. Such x-rays reflect from ideal crystals only over a minute part of the angular range that must be searched for the reflection. Spoiling the incoming x-rays' directionality with sandpaper makes it easier to find the reflection.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1464634
- Alternate ID(s):
- OSTI ID: 1420019
- Journal Information:
- Review of Scientific Instruments, Vol. 89, Issue 2; ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Analysis and implementation of a space resolving spherical crystal spectrometer for x-ray Thomson scattering experiments
|
journal | April 2015 |
Spherical quartz crystals investigated with synchrotron radiation
|
journal | October 2015 |
Advanced in situ metrology for x-ray beam shaping with super precision
|
journal | January 2015 |
Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments
|
journal | November 2014 |
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