A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution

Zastrau, U.; Rodel, C.; Nakatsutsumi, M.; Feigl, T.; Appel, K.; Chen, B.; Doppner, T.; Fennel, T.; Fiedler, T.; Fletcher, L. B.; Forster, E.; Gamboa, E.; Gericke, D. O.; Gode, S.; Grote-Fortmann, C.; Hilbert, V.; Kazak, L.; Laarmann, T.; Lee, H. J.; Mabey, P.; Martinez, F.; Meiwes-Broer, K. -H.; Pauer, H.; Perske, M.; Przystawik, A.; Roling, S.; Skruszewicz, S.; Shihab, M.; Tiggesbaumker, J.; Toleikis, S.; Wunsche, M.; Zacharias, H.; Glenzer, S. H.; Gregori, G.

doi:10.1063/1.5007950

Title: A sensitive EUV Schwarzschild microscope for plasma studies with sub-micrometer resolution

Journal Article · Mon Feb 05 00:00:00 EST 2018 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.5007950· OSTI ID:1430988

^[1]; Rodel, C. ^[2]; Nakatsutsumi, M. ^[1]; Feigl, T. ^[3]; Appel, K. ^[1]; Chen, B. ^[4]; Doppner, T. ^[5]; Fennel, T. ^[6]; Fiedler, T. ^[3]; Fletcher, L. B. ^[7]; Forster, E. ^[8]; Gamboa, E. ^[7]; Gericke, D. O. ^[9]; Gode, S. ^[1]; Grote-Fortmann, C. ^[1]; Hilbert, V. ^[10]; Kazak, L. ^[6];

^[11]; Lee, H. J. ^[7]; Mabey, P. ^[12] more »

European X-ray Free-Electron Laser (XFEL), Schenefeld (Germany)
Friedrich Schiller Univ., Jena (Germany). Inst. of Optics and Quantum Electronics; SLAC National Accelerator Lab., Menlo Park, CA (United States); Helmholtz Inst. Jena, Jena (Germany)
optiX fab GmbH, Jena (Germany)
China Academy of Engineering Physics, Mianyang (China)
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Univ. of Rostock (Germany). Inst. fur Physik
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Friedrich Schiller Univ., Jena (Germany). Inst. of Optics and Quantum Electronics; Helmholtz Inst. Jena, Jena (Germany)
Univ. of Warwick, Coventry (United Kingdom). Centre for Fusion, Space and Astrophysics, Dept. of Physics
Friedrich Schiller Univ., Jena (Germany). Inst. of Applied Physics
Hamburg Centre for Ultrafast Imaging CUI, Hamburg (Germany)
Univ. of Oxford (United Kingdom). Clarendon Lab., Dept. of Physics
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Westfalische Wilhelms-Univ., Munster (Germany). Physikalisches Inst.
Univ. of Rostock (Germany). Inst. fur Physik; Tanta Univ., Tanta (Egypt). Dept. of Physics, Faculty of Science

We present an extreme ultraviolet (EUV) microscope using a Schwarzschild objective which is optimized for single-shot sub-micrometer imaging of laser-plasma targets. The microscope has been designed and constructed for imaging the scattering from an EUV-heated solid-density hydrogen jet. Imaging of a cryogenic hydrogen target was demonstrated using single pulses of the free-electron laser in Hamburg (FLASH) free-electron laser at a wavelength of 13.5 nm. In a single exposure, we observe a hydrogen jet with ice fragments with a spatial resolution in the sub-micrometer range. In situ EUV imaging is expected to enable novel experimental capabilities for warm dense matter studies of micrometer-sized samples in laser-plasma experiments.

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Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Fusion Energy Sciences (FES); Volkswagen Foundation

Grant/Contract Number:: AC52-07NA27344; 654220; FWP100182

OSTI ID:: 1430988

Alternate ID(s):: OSTI ID: 1419609

Report Number(s):: LLNL-JRNL-740214; TRN: US1802639

Journal Information:: Review of Scientific Instruments, Vol. 89, Issue 2; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 8 works

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Cited By (4)

Ionization dynamics of dense matter generated by intense ultrashort X-ray pulses Shihab, Mohammed; Bornath, Thomas; Redmer, Ronald Contributions to Plasma Physics, Vol. 59, Issue 4-5 https://doi.org/10.1002/ctpp.201800156	journal	February 2019
Characterization of high spatial resolution lithium fluoride X-ray detectors Mabey, P.; Albertazzi, B.; Michel, Th. Review of Scientific Instruments, Vol. 90, Issue 6 https://doi.org/10.1063/1.5092265	journal	June 2019
Full-field microscope with twin Wolter mirrors for soft X-ray free-electron lasers Egawa, Satoru; Owada, Shigeki; Motoyama, Hiroto Optics Express, Vol. 27, Issue 23 https://doi.org/10.1364/oe.27.033889	journal	January 2019
Wavefront Sensing for Evaluation of Extreme Ultraviolet Microscopy Ruiz-Lopez, Mabel; Mehrjoo, Masoud; Keitel, Barbara Sensors, Vol. 20, Issue 22 https://doi.org/10.3390/s20226426	journal	November 2020

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