Effects of Defects and Contacts on Electrical Field of Compound Semiconductor Detectors: Case Analysis of CdZnTe
Conference
·
OSTI ID:1430837
Investigate internal electric field of CZT detectors by Pockels effect measurements
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
- DOE Contract Number:
- SC0012704
- OSTI ID:
- 1430837
- Report Number(s):
- BNL-203397-2018-COPR
- Resource Relation:
- Conference: Optical Engineering + Applications 2016 – Part of SPIE Optics + Photonics, San Diego, California, 8/28/2016 - 9/1/2016
- Country of Publication:
- United States
- Language:
- English
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