Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

Kozina, M.; Hu, T.; Wittenberg, J. S.; Szilagyi, E.; Trigo, M.; Miller, T. A.; Uher, C.; Damodaran, A.; Martin, L.; Mehta, A.; Corbett, J.; Safranek, J.; Reis, D. A.; Lindenberg, A. M.

doi:10.1063/1.4875347

Title: Measurement of transient atomic displacements in thin films with picosecond and femtometer resolution

Journal Article · Tue May 06 00:00:00 EDT 2014 · Structural Dynamics

DOI:https://doi.org/10.1063/1.4875347· OSTI ID:1370096

Kozina, M. ^[1]; Hu, T. ^[1]; Wittenberg, J. S. ^[2]; Szilagyi, E. ^[1]; Trigo, M. ^[3]; Miller, T. A. ^[1]; Uher, C. ^[4]; Damodaran, A. ^[5]; Martin, L. ^[5]; Mehta, A. ^[2]; Corbett, J. ^[2]; Safranek, J. ^[2]; Reis, D. A. ^[1]; Lindenberg, A. M. ^[1]

SLAC National Accelerator Lab., Menlo Park, CA (United States). Photon Ultrafast Laser Science and Engineering Inst. (PULSE); Stanford Univ., CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States). Photon Ultrafast Laser Science and Engineering Inst. (PULSE)
Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Physics
Univ. of Illinois at Urbana-Champaign, IL (United States). Dept. of Materials Science and Engineering

We report measurements of the transient structural response of weakly photo-excited thin films of BiFeO₃, Pb(Zr,Ti)O₃, and Bi and time-scales for interfacial thermal transport. Utilizing picosecond x-ray diffraction at a 1.28 MHz repetition rate with time resolution extending down to 15 ps, transient changes in the diffraction angle are recorded. These changes are associated with photo-induced lattice strains within nanolayer thin films, resolved at the part-per-million level, corresponding to a shift in the scattering angle three orders of magnitude smaller than the rocking curve width and changes in the interlayer lattice spacing of fractions of a femtometer. The combination of high brightness, repetition rate, and stability of the synchrotron, in conjunction with high time resolution, represents a novel means to probe atomic-scale, near-equilibrium dynamics.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Solar and Thermal Energy Conversion (CSTEC)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0000957

OSTI ID:: 1370096

Journal Information:: Structural Dynamics, Vol. 1, Issue 3; Related Information: CSTEC partners with University of Michigan (lead); Kent State University; ISSN 2329-7778

Publisher:: American Crystallographic Association/AIPCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 20 works

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Optimized spatial overlap in optical pump–X-ray probe experiments with high repetition rate using laser-induced surface distortions Reinhardt, Matthias; Koc, Azize; Leitenberger, Wolfram Journal of Synchrotron Radiation, Vol. 23, Issue 2 https://doi.org/10.1107/s1600577515024443	journal	February 2016
Atomic-scale imaging of ultrafast materials dynamics Flannigan, David J.; Lindenberg, Aaron M. MRS Bulletin, Vol. 43, Issue 7 https://doi.org/10.1557/mrs.2018.146	journal	July 2018
Feasibility of Valence-to-Core X-ray Emission Spectroscopy for Tracking Transient Species March, Anne Marie; Assefa, Tadesse A.; Bressler, Christian The Journal of Physical Chemistry C, Vol. 119, Issue 26 https://doi.org/10.1021/jp511838q	journal	February 2015
Cavity-induced modifications of molecular structure in the strong coupling regime Galego, Javier; Garcia-Vidal, Francisco J.; Feist, Johannes arXiv https://doi.org/10.48550/arxiv.1506.03331	text	January 2015

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